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Course: ME 563, Spring 2011School: Auburn
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Auburn - ME - 563
Auburn - ME - 563
Auburn - ME - 563
Auburn - ME - 563
Auburn - ME - 563
Auburn - ME - 563
Auburn - ME - 563
Auburn - ME - 563
Auburn - ME - 563
Chapter 7Solutions2.1 Using the denitions for Ret and Re , the relation between and ( = 15 u2 /2 ), andthe estimate = u3 /Lturb , we obtain:Re =uu2 215u4 Lturb15 u21/2= 15Ret Re = 15Ret Re2 = 2 = u2 2 = u32.2 Using u = 10 m/s and u/u = 0.1, w
Auburn - ME - 563
Stability and Transition to TurbulenceLinear estimates for neutral stability To estimate conditions under which parallel flows begin to be unstable, look at conditions under which an initially infinitesimal disturbance will grow exponentially. Begin with
Auburn - ME - 563
A.3. CURVILINEAR COORDINATES75A.3.1 Tensor invarianceLets presume that xi is the old Cartesian coordinate system, and x j represents the new curvilinear coordinate system. Both systems are related by transformation rules (A.4) and (A.10). The distance
Auburn - ME - 563
Prof. Dr. May-Britt KallenrodeFachbereich PhysikModeling TransportOsnabrck, 13th November 2006 uContents1 What is Transport? 1.1 What is transport? A Guided Tour . . . . . . . . . . . . . . . . . . 1.2 Help, I still cant dene Transport . . . . . . .
Auburn - ME - 563
Tony Burdens Lecture Notes on Turbulence, Spring 2007Chapter 3. Thin Shear Layers and Free Shear Flows 3a Thin-shear-layer Equationsexamples free shear ows, such as jets, wakes and mixing layers, and wallbounded ows, such as boundary layers and wall jet
Auburn - ME - 563
FACE8 Turbulence and MxingTurbulence and mixingFACE8 20071Course outlineLARFACE8 Turbulence and Mxing1 MMIntroduction to turbulenceBasic concepts of turbulent flowTurbulent flow structuresEnergy cascadeTurbulent energy spectrum2 MM Introduct
Auburn - ME - 563
FACE8 Turbulence and MixingTurbulence and MixingFACE8 20061Recommended readingFACE8 Turbulence and MixingFrank M. White (1991): Viscous fluid flow, McGrawHill International Editions, Mechanical EngineeringSeries. ISBN0-07-100995-7H. Schlichting an
Auburn - ME - 563
FACE8 Turbulence and MixingTurbulence and Mixing3rd lectureBoundary layers revisittedFree shear flowsFACE8 20071Buffer layerHigh dissipation2Laminar/viscous sublayerTurbulence freeFACE8 Turbulence and MixingTurbulent boundary layersFACE8 Tur
Auburn - ME - 563
FACE8TurbulenceTurbulenceLectures3&4Modelling1Courseoutline2MM3MM4MM21MMFACE8Turbulence5MM Introductiontoturbulence Basicconceptsofturbulentflow Turbulentflowstructures Energycascade Turbulentenergyspectrum Turbulentlengthandtimescales
Auburn - ME - 563
Lessons from Hydrodynamic TurbulenceTurbulent flows, with their irregular behavior, confound any simple attempts to understand them. But physicists have succeeded in identifying some universal properties of turbulence and relating them to broken symmetri
Auburn - ME - 563
3D TURBULENCE13D TURBULENCEW. D. Smyth and J. N. Moum, College of Oceanic & Atmospheric Sciences, Oregon State University, Corvallis, OR 97330, USACopyright^2001 Academic Pressdoi:10.1006/rwos.2001.0134Introduction0001000200030004This article
Auburn - ME - 563
Lecture Notes in TurbulenceSteve Berg2nd June 2004Contents1 Conservation Equations21.1Conservation of Mass . . . . . . . . . . . . . . . . . . . . . . . .21.2Conservation of Moment . . . . . . . . . . . . . . . . . . . . . .42 Turbulent Theory
Auburn - ME - 563
Turbulent Mixing in the MicroscaleW.Dzwinel1, W.Alda1, M.Pogoda1 and D.A.Yuen21University of Mining and Metallurgy, Institute of Computer Science, 30-059 Krakw, Poland2Minnesota Supercomputer Institute, University of Minnesota, Minneapolis, USAAbstr
Auburn - ELEC - 7250
LOGIC SIMULATION AND FAULTDIAGNOSISBY JINS DAVIS ALEXANDERELEC 7250 PRESENTATION14/20/2006ELEC7250: AlexanderPROBLEM STATEMENT2To write a logic simulator to verify combinationalcircuits given a set of input vectors and the expectedoutput respon
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A Robust Logic Simulator UsingRobustDynamic LevelizationDynamicKasi L. K. AnbumonyDept. of Electrical EngineeringAuburn University, AL 36849 USA20 April 2006VLSI Testing-Final Project Presentation1Motivation for This Work Logic simulator to ver
Auburn - ELEC - 7250
LogicSimulatorforHierarchicalBenchHillaryGrimesIIITermProjectELEC7250Spring20064/20/2006ELEC7250 Project: Grimes1ProblemStatementDevelopaLogicSimulatorforZeroDelayBooleangatestoperformcircuitverification.Inputs:HierarchicalBenchCircuitDescripti
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Brad HillELEC 7250Logic Simulator4/25/20064/25/2006ELEC7250: Hill1Simulation Table Table createdTableGate NameFan-in and Fan-out Input and Output Array Signal Array Holds Signal Value during simulation Set to 0 before each vector is applied
Auburn - ELEC - 7250
ELEC 7250 VLSI Testing (Spring 2006)Place and Time: Broun 235, Tuesday/Thursday, 11:00AM-12:15PM Course Website: http:/www.eng.auburn.edu/~vagrawal/COURSE/E7250_06/course.html Catalog data: ELEC 7250. VLSI Testing (3) Lec. 3. Pr., ELEC 6770. Introduction
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Lecture 8Testability MeasuresssssDefinitionControllability and observabilitySCOAP measures Combinational circuits Sequential circuitsSummaryCopyright 2001, Agrawal & BushnellVLSI Test: Lecture 8alt1What are Testability Measures?ssApproxi
Auburn - ELEC - 7250
Lecture 9altCombinational ATPG(A Shortened version of Original Lectures 9-12)sssssATPG problemAlgorithmsMulti-valued algebraD-algorithmPodemATPG systemSummaryExerciseCopyright 2001, Agrawal & BushnellVLSI Test: Lecture 9alt1ATPG Problem
Auburn - ELEC - 7250
Lecture 10Combinational ATPG andLogic RedundancyssRedundancy identificationRedundancy removalCopyright 2001, Agrawal & BushnellVLSI Test: Lecture 101Irredundant Hardware andTest PatternssCombinational ATPG cannot always find redundant(unnece
Auburn - ELEC - 7250
Lecture 11altAdvances in CombinationalATPG AlgorithmsBranch and Bound SearchFAN Multiple Backtrace, head lines (1983)TOPS Dominators (1987)SOCRATES Learning (1988)EST Search space learning (1991)ATPG Performance improvementsSummaryCopyright 2001
Auburn - ELEC - 7250
Lecture 13Sequential Circuit ATPGTime-Frame Expansion(Lecture 12alt in the Alternative Sequence)ssProblem of sequential circuit ATPGTime-frame expansionssssssNine-valued logicATPG implementation and drivabilityComplexity of ATPGCycle-free
Auburn - ELEC - 7250
Lecture 14Sequential Circuit ATPGSimulation-Based Methods(Lecture 13alt in the Alternative Sequence)sssssUse of fault simulation for test generationContests Directed searchs Cost functionsGenetic AlgorithmsSpectral MethodsSummaryCopyright
Auburn - ELEC - 7250
Lecture 14altMemory Test(Alternative for Lecture 15)Memory organizationMemory test complexityFaults and fault modelsMATS+ march testAddress Decoder faultsSummaryReferencesCopyright 2005, Agrawal & BushnellVLSI Test: Lecture 14alt1RAM Organiza
Auburn - ELEC - 7250
Lecture 15altMemory NPSF and ParametricTest(Alternative for Lecture 16)Definitions of NPSFsNPSF test algorithmsParametric testsSummaryReferencesCopyright 2005, Agrawal & BushnellVLSI Test: Lecture 15alt1Neighborhood PatternSensitive FaultsDe
Auburn - ELEC - 7250
Lecture 16altAnalog Circuit Test(Alternative to Lectures 17, 18, 19 and 30) Analog circuits Analog circuit test methods Specification-based testing Direct measurement DSP-based testing Fault model based testing IEEE 1149.4 analog test bus standar
Auburn - ELEC - 7250
Lecture 18altIDDQ Testing(Alternative for Lectures 21 and 22)sDefinitionFaults detected by IDDQ testss Weak faults Leakage faults Sematech and other studiessIDDQ testings Built-in current (BIC) sensors SummarysCopyright 2005, Agrawal & Bushn
Auburn - ELEC - 7250
Lecture 20Delay Test(Lecture 17alt in the Alternative Sequence)sssDelay test definitionCircuit delays and event propagationPath-delay testsssPath-delay fault (PDF) and other fault modelsTest application methodssssNon-robust testRobust tes
Auburn - ELEC - 7250
Lecture 20altDFT: Partial, Random-Access &Boundary ScansssssDefinitionPartial-scan architectureHistorical backgroundCyclic and acyclic structuresPartial-scan by cycle-breakingssssS-graph and MFVS problemTest generation and test statistic
Auburn - ELEC - 7250
Lecture 21altBIST - Built-In Self-Test(Alternative to Lectures 25, 26 and 27)sssssDefinition of BISTPattern generators LFSRResponse analyzers MISRs Aliasing probabilityBIST architecturess Test per scans Test per clocks Circular self-test
Auburn - ELEC - 7250
Lecture 23Design for Testability (DFT): FullScan(Lecture 19alt in the Alternative Sequence)s Definitions Ad-hoc methodss Scan designsDesign rulesScan registerScan flip-flopsScan test sequencesOverheadsScan design systemSummaryCopyright 2001,
Auburn - ELEC - 7250
Lecture 31System Test(Lecture 22alt in the Alternative Sequence)sssssDefinitionFunctional testDiagnostic test Fault dictionary Diagnostic treeSystem design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhe
Auburn - ELEC - 7250
VLSI TestingTerm Project PresentationDaniel MiltonProject Accomplishments (sofar)Each student is challenged to create ownlogic simulator for BENCH format andinclude an extension for hierarchy.UML Class DiagramProgram ImplementationUsed Java 1.5
Auburn - ELEC - 7250
LogicSimulatorforCombinationalCircuitJie QinDept.ofElectricalandComputerEngineeringAuburnUniversity,AL36849,USA04/25/200604/25/2006ELEC7250FinalProject:JieQin1ProblemStatement Developalogicsimulatorwithsupportforthestandardbenchformatandthehie
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1RF Testing D. Gizopoulos, Editor, Advances in Electronic Testing: Challenges and Methodologies, Springer, 2006, pp. 337-369.bChapter 10RF TestingRandy Wolf, Mustapha Slamani, John Ferrario and Jayendra BhagatIBM10.0 INTRODUCTIONToday's wireless
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ELEC 7250 VLSI Testing Project ReportSubmitted By: Khushboo ShethContents1.Preface.3 Project Part 1.4 Project Part 2.21 Project Part-3.32 Project Part-4.51 Results .58 Conclusion and References.592.3.4.5.6.7.21.PrefaceToday's world has been
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ELEC 7250Term Project PresentationKhushboo ShethDepartment of Electrical and Computer EngineeringAuburn University, Auburn, ALProblem 1Problem statement: Develop a compiler for the hierarchical formatwith 2 options for the user : Default option and
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Independence Fault Collapsing and Concurrent Test GenerationExcept where reference is made to the work of others, the work described in thisthesis is my own or was done in collaboration with my advisory committee. Thisthesis does not include proprietar
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Final Project ReportELEC7250 Spring 2006Instructor: Professor Vishwani D. AgrawalFan Wang Dept. of Electrical & Computer Engineering Auburn UniversityApril 29, 20061.2 1 Introduction.2 2 Project Objectives.2 3 Project Process.23.1 Circuit Descripti
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Logic simulator and fault diagnosisLogicFan WangDept. of Electrical & Computer EngineeringDept.Auburn UniversityAuburnELEC7250 Term Project Spring 06MotivationsMotivationsWrite a compiler for the hierarchical benchWrite compilerformat.format.
Auburn - ELEC - 7250
ELEC7250 VLSI Testing:Final ProjectAndrew WhiteAndrew4/27/20064/27/2006ELEC7250: White1OverviewProblem DescriptionPlanResultsDemonstration4/27/20064/27/2006ELEC7250: White2PlanCompiler Hierarchical bench formats are flattenedLogic Simu
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Andrew WhiteBoundary Scan StandardAndrew WhiteAbstract Boundary scan, also known as IEEE standard 1149.1, is described by the Test Technology Standards Committee of the IEEE Computer Society as "circuitry that may be built into an integrated circuit to
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High-level Power AnalysisCopyright Agarwal & Srivaths, 2007Low-Power Design and Test, Lecture 4OutlineBackground CMOS Power Consumption Basics Why Address Power Consumption Issues in High-LevelDesignHigh-Level Power Analysis RTL Power Estimation
Auburn - ELEC - 4944
High-level Power Reduction andManagementCopyright Agarwal & Srivaths, 2007Low-Power Design and Test, Lecture 7OutlineGeneral ObservationsRTL Power Management Techniques Gated Clock Architecture Precomputation Guarded EvaluationBehavior-Level Pow
Auburn - ELEC - 4944
Test PowerCopyright Agarwal & Srivaths, 2007Low-Power Design and Test, Lecture 8OutlineTest Power Problem: Background and BasicsIncreasing Test Power ConcernsAspects of Test Power DissipationDFT techniques targeting test powerPower-aware ATPGPowe
Auburn - ELEC - 4944
ELEC 7770: Advanced VLSI DesignSpring 2010(Also, ELEC 7250 Class on March 11, 2010)Radio Frequency (RF) TestingVishwani D. AgrawalJames J. Danaher ProfessorECE Department, Auburn UniversityAuburn, AL 36849vagrawal@eng.auburn.eduhttp:/www.eng.aubu
Auburn - ELEC - 4944
LowPowerDesignandTestIntroductionVishwaniD.AgrawalAuburnUniversity,USAvagrawal@eng.auburn.eduSrivathsRaviTexasInstrumentsIndiaSrivaths.ravi@ti.comHyderabad,July3031,2007http:/www.eng.auburn.edu/~vagrawal/hyd.htmlCopyrightAgrawal&Srivaths,2007Co
Auburn - ELEC - 4944
LowPowerDesignandTestDynamicandStaticPowerinCMOSVishwaniD.AgrawalAuburnUniversity,USAvagrawal@eng.auburn.eduSrivathsRaviTexasInstrumentsIndiaSrivaths.ravi@ti.comHyderabad,July3031,2007http:/www.eng.auburn.edu/~vagrawal/hyd.htmlCopyrightAgrawal&
Auburn - ELEC - 4944
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Auburn - ELEC - 4944
LowPowerDesignandTestGateLevelPowerOptimizationVishwaniD.AgrawalAuburnUniversity,USAvagrawal@eng.auburn.eduSrivathsRaviTexasInstrumentsIndiaSrivaths.ravi@ti.comHyderabad,July3031,2007http:/www.eng.auburn.edu/~vagrawal/hyd.htmlCopyrightAgrawal&Sr
Auburn - ELEC - 4944
LowPowerDesignandTestMemoryandMulticoreDesignVishwaniD.AgrawalAuburnUniversity,USAvagrawal@eng.auburn.eduSrivathsRaviTexasInstrumentsIndiaSrivaths.ravi@ti.comHyderabad,July3031,2007http:/www.eng.auburn.edu/~vagrawal/hyd.htmlCopyrightAgrawal&Sriv
Auburn - ELEC - 4944
Summary for the course:=Power consumption of a CMOS circuit has emerged as an important design dimension in the nanometerera. The benefits of higher device density and increased clock rates for the modern VLSI system-on-chip(SOC) come at the cost of s