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Syracuse - ECN - 205
Nick Pulis SPM 205 Extra Credit 10-12-11 Conference realignment has had a major impact on all college athletics over the course of the last two decades. In many cases the impact has been both positive in negative in several different ways. Today, the NCAA
Syracuse - ECN - 205
Principles of Sport Management Fall 2011Nature of Sport & Its Economic ImpactGrowth of the Sports Industry Untilthe 2008 economic recession, the sport industry was experiencing tremendous growth. and affective sports management is playing an important
Syracuse - ECN - 205
Principles of Sport Management Fall 2011Nature of Sport & Its Economic ImpactGrowth of the Sports Industry Untilthe 2008 economic recession, the sport industry was experiencing tremendous growth. and affective sports management is playing an important
Syracuse - SPM - 215
1 Nick Pulis SPM 205 10/3/2011 Lockout Assignment Professional sport leagues throughout the United States are organized and structured with great governance. However, over the course of the last 50 years these sport associations have come across periodic
Syracuse - SPM - 215
Nick Pulis SPM 205 Extra Credit 10-3-2011 Lockouts are one of the most detrimental occurrences in sports. There have been many lockouts over the years and most of them were caused by one thing, money. When players begin to get to greedy, or when owners be
Syracuse - SPM - 215
Nick Pulis Extra-CreditSPM 205Entertainment in sports has revolutionized every major sporting event that the United States of America has to offer. Games such as the Super Bowl and the World Series benefit tremendously from entertainment. Each and every
Syracuse - SPM - 215
SPM 205Professional SportsProfessional Sport Professional sport is any sport activity orskill for which an athlete receives compensation. Compensations can come in the form of:1. 2. 3. 4. Salary Bonuses Reimbursement for Expenses Any other form of di
Syracuse - SPM - 215
SPM 205Professional SportsProfessional Sport Professional sport is any sport activity orskill for which an athlete receives compensation. Compensations can come in the form of:1. 2. 3. 4. Salary Bonuses Reimbursement for Expenses Any other form of di
Syracuse - SPM - 215
Nick Pulis Interview QuestionsSPM 205 9/17/111) Where do you work? 2) What does your day-to-day job consist of? (Multiple questions throughout her explanation) 3) What is your educational background? 4) Have you had any internships? 5) Why did you enter
Syracuse - SPM - 215
SPM 215: Principal of Sales in Sport NotesMonday January 23, 2012: Wk02-D01 Quick Review This is the stuff that will be on the test Contact Management CM. Customer Relationship Management Characteristics of a Successful Salesperson Ability To listen Can
Syracuse - SPM - 215
Nick Pulis Interview Amy FancherSPM 205 9/18/11When asked why she entered the sports industry she simply responds, "I love sports." All her life she was involved with sports, but baseball topped the list. As the years went by the passion grew stronger a
Syracuse - SPM - 215
Nick Pulis SPM 205 Essay 11/25/11 Sport is the combination of many criteria that are brought together to develop one of the world's greatest entertainment entities. One aspect of sport that is under appreciated in the world today is sport management and m
Syracuse - SPM - 215
Nick Pulis SPM 205 Extra Credit 11-29-11 One key component in ensuring an event is successful is crowd control. The crowd at a sporting event is one of the most important factors of the game. Making sure that nobody is hurt and everyone is safe is very im
Syracuse - SPM - 215
Total Fan Experience & Sports MarketingSport Marketing "The specific application of marketing principles and processes to sport products; and to the marketing of nonsports products through association with sport." Shank (Ex: Selling games tickets or at
Syracuse - SPM - 215
Nick Pulis StakeholdersSPM 205 9/18/11Within the sport industry important decisions are made each and every day. These decisions effect more than just the person or organization that made the decision. A stakeholder is a person, group, organization, or
Iowa State - EE - 330
APPLICATION NOTEThyristors & Triacs - Ten Golden Rules for Success In Your Application.This Technical Publication aims to provide an interesting, descriptive and practical introduction to the golden rules that should be followed in the successful use of
Iowa State - EE - 330
Cadence Spectre Model Library Tutorial Step 1: Edit "cds.lib" fileRecall Lab 1 early in the semester. To setup Cadence to the specific model library, you need to define or include the available model library. There are two level of "cds.lib" files set up
Iowa State - EE - 330
Triac Control Using the COP400 Microcontroller FamilyTriac Control Using the COP400 Microcontroller FamilyTable of Contents1 0 TRIAC CONTROL 1 1 Basic Triac Operation 1 2 Triggering 1 3 Zero Voltage Detection 1 4 Direct Couple 1 5 Pulse Transformer Int
Iowa State - EE - 330
EE 330 Exam 1 Fall 2009Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: Students may bring 1 page of notes (front and back) to this exam. There are 8 questions and 6 problems. The points allocated to each question and each problem are as indicated. Please s
Iowa State - EE - 330
EE 330 Exam 1 Fall 2010Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: Students may bring 1 page of notes (front and back) to this exam. There are 8 questions and 6 problems. The points allocated to each question and each problem are as indicated. Please s
Iowa State - EE - 330
EE 330 Exam 1 Fall 2011Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: Students may bring 1 page of notes (front and back) to this exam. There are 8 questions and 6 problems. The points allocated to each question and each problem are as indicated. Please s
Iowa State - EE - 330
EE 330 Exam 1 Spring 2011Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: Students may bring 1 page of notes (front and back) to this exam. There are 8 questions and 6 problems. The points allocated to each question and each problem are as indicated. Please
Iowa State - EE - 330
EE 330 Exam 2 Fall 2009Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: Students may bring 2 page of notes (front and back) to this exam. There are 8 questions and 8 problems. The points allocated to each question are as indicated. The problems are worth 16
Iowa State - EE - 330
EE 330 Exam 2 Fall 2010Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: Students may bring 2 page of notes (front and back) to this exam. There are 8 questions and 5 problems. The points allocated to each question are as indicated. The problems are all equa
Iowa State - EE - 330
EE 330 Exam 2 Fall 2011Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: This is a 50-minute exam. Students may bring 2 page of notes (front and back) to this exam. There are 7 questions and 5 problems. The points allocated to each question are as indicated.
Iowa State - EE - 330
EE 330 Exam 2 Fall 2011Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: This is a 50-minute exam. Students may bring 2 page of notes (front and back) to this exam. There are 7 questions and 5 problems. The points allocated to each question are as indicated.
Iowa State - EE - 330
EE 330 Exam 2 Spring 2011Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: This is a 50-minute exam. Students may bring 2 page of notes (front and back) to this exam. There are 8 questions and 5 problems. The points allocated to each question are as indicate
Iowa State - EE - 330
EE 330 Exam 2 Spring 2011Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: This is a 50-minute exam. Students may bring 2 page of notes (front and back) to this exam. There are 8 questions and 5 problems. The points allocated to each question are as indicate
Iowa State - EE - 330
EE 330 Exam 3 Fall 2010Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: Students may bring 3 page of notes (front and back) to this exam. There are 8 questions and 8 problems. The points allocated to each question are as indicated. The problems are worth 16
Iowa State - EE - 330
EE 330 Exam 3 Fall 2011Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: This is a 50 minute exam. Students may bring 3 page of notes (front and back) to this exam. The points for the first eight questions are as indicated. The 5 problems are worth 16 points
Iowa State - EE - 330
EE 330 Exam 3 Spring 2011Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: This is a 50 minute exam. Students may bring 3 page of notes (front and back) to this exam. The points for the first eight questions are as indicated. The 5 problems are worth 16 poin
Iowa State - EE - 330
EE 330 Exam 3 Spring 2011Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions: This is a 50 minute exam. Students may bring 3 page of notes (front and back) to this exam. The points for the first eight questions are as indicated. The 5 problems are worth 16 poin
Iowa State - EE - 330
EE 330 Final Exam Fall 2008Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions. Students may bring 2 page of notes (front and back) to this exam. There are 10 questions and 8 problems. There are 2 points allocated to each question and 10 points allocated to eac
Iowa State - EE - 330
EE 330 Final Exam Fall 2009Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions. Students may bring 3 pages of notes (3 front + 3 back) to this exam. There are 8 questions and 8 problems. The points allocated to each question are as indicated. The problems are a
Iowa State - EE - 330
EE 330 Final Exam Fall 2010Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions. Students may bring 3 pages of notes (3 front + 3 back) to this exam. There are 8 questions and 8 problems. The points allocated to each question are as indicated. The problems are a
Iowa State - EE - 330
EE 330 Final Exam Spring 2011Name_ _ _ _ _ _ _ _ _ _ _ _ _ _Instructions. Students may bring 3 pages of notes (3 front + 3 back) to this exam. There are 9 questions and 8 problems. The points allocated to each question are as indicated. The problems are
Iowa State - EE - 330
Jan 17 is a University Holiday No lecture given on this date
Iowa State - EE - 330
HW1Problem 1 Assume a simple circuit requires 10,000 MOS transistors on a die and that all transistors are minimum sized. If the transistors are fabricated in a 32nm CMOS process and the spacing overhead for the transistors is a factor of 10, determine t
Iowa State - EE - 330
EE 330 Homework 1 Spring 2012 Due Friday Jan 13 Problem 1 Assume a simple circuit requires 10,000 MOS transistors on a die and that all transistors are minimum sized. If the transistors are fabricated in a 32nm CMOS process and the spacing overhead for th
Iowa State - EE - 330
HW2 solutionProblem 1. Extrapolating the data from Figure 1.4, predict the transistor count of a microprocessor in 2016. Solution 6 to 12 billion Problem 2. Sketch a transistor-level schematic for CMOS 4-input NOR gate. SolutionABCD YABCDProblem
Iowa State - EE - 330
EE 330 Homework Assignment 3 Spring 2012Problem 1 Problem 1.6 of WH parts b) and c). Modify this problem to design of these functions using both the compound gate approach and the static CMOS gate approach. Compare the number of levels of logic and the t
Iowa State - EE - 330
EE 330 Homework Assignment 4 Spring 2012 (Due Friday Feb 3)Problem 1 Problem 2 Problem 3 Problem 4 Problem 53.1 of Weste and Harris (WH) 3.2 of WH 3.5 of WH 3.7 of WH A first-order RC filter is shown. The 3dB band edge of this filter is given 1 by 3dB .
Iowa State - EE - 330
EE 330 Fall 2010 Lab 1: Cadence Custom IC design tools - Setup, Schematic capture and simulationObjectiveThe objective of this lab is to familiarize you with the basics of the Cadence Custom IC design tool, Virtuoso. You will first set up your account t
Iowa State - EE - 330
EE 330 Spring 2011 Laboratory 2: Basic Boolean CircuitsObjective:The objective of this experiment is to investigate methods for evaluating the performance of Boolean circuits. Emphasis will be placed on the basic CMOS inverter but the concepts are appli
Iowa State - EE - 330
EE 330 Laboratory 3 Layout and LVS (Layout Versus Schematic)Fall 2011 Objective: The objective of this experiment is introduce the concept of layout of circuits. In this context, design rules and CAD tools used for verifying that all design rules are sat
Iowa State - EE - 330
EE 330 Section: _Name: _Pre-Lab for Lab 4: From Boolean Function to Silicon1) Draw the layout for your inverter and the other gate you chose (3-input NAND or NOR) 2) Attach the hand-drawn gate level implementation of the assigned Boolean function that
Iowa State - EE - 330
EE 330 Laboratory 4 From Boolean equation to SiliconFall 2010Objective:The objective of this experiment is to implement a Boolean function description in silicon, given area and pin constraints. A second object is to introduce the concept of parameteri
Iowa State - EE - 330
EE 330 Laboratory 5 Creating bonding padsSpring 2011Objective: The objective of this experiment is investigate the design of a basic bonding pad andsimple ESD protection circuitry.Part 1: Layout of a resistorThe first step of this lab is to learn how
Iowa State - EE - 330
EE 330 Laboratory 6 Models for MOS DevicesSpring 2011Part 1: IntroductionThe mathematical relationship between the terminal currents and voltages for a device is termed the device model. Although the basic operation of the MOS transistor is quite strai
Iowa State - EE - 330
EE 330 Laboraory 7 MOSFET Device Characterization and ApplicationsFall 2010 Objective: The objective of this laboratory experiment is to become more familiar with the operation of the MOS transistor, to develop methods for measuring key parameters of the
Iowa State - EE - 330
EE 330 Laboraory 8 Thyristor Device Characterization and ApplicationsFall 2011Objective: The objective of this laboratory experiment is to become familiar with the operation thyristors, to develop methods for measuring key parameters of thyristors, , an
Iowa State - EE - 330
EE 330 Laboratory 9 Semiconductor Parameter Measurement and Thyristor ApplicationsSpring 2011Objective: The objective of this laboratory experiment is to become familiar with using a semiconductor parameter analyzer for extracting model parameters for d
Iowa State - EE - 330
EE 330 Laboratory 10 Bipolar Devices and ApplicationsFall 2010Objective:The objective of this laboratory is to investigate applications of BJTsDiscussion:Although the major emphasis in this course has been on integrated devices, discrete transistors
Iowa State - EE - 330
EE 330 Laboratory Experiment Number 11 Design, Simulation and Layout of Digital Circuits using Hardware Description LanguagesPurpose: The purpose of this experiment is to develop methods for using HardwareDescription Languages for the design of digital
Iowa State - EE - 330
EE 330 Fall 2011Integrated ElectronicsLecture Instructor: Randy Geiger 2133 Coover rlgeiger@iastate.edu 294-7745Lab Instructors: Rui Bai Yongjie Jiang Curtis Mayberry Srijita Patra Brian Modtland bairui@iastate.edu yjjiang@iastate.edu curtisma@iastate.
Iowa State - EE - 330
EE 330 Fall 2009Integrated ElectronicsLecture Instructor: Randy Geiger 2133 Coover rlgeiger@iastate.edu 294-7745 Sheng-Huang (Alex) Lee and Dan Congreve http:/class.ece.iastate.edu/ee330/ 1012 CooverLab Instructors: Web Site: Lecture: MWF 9:00 Lab: Sec
Iowa State - EE - 330
EE 330 Lecture 2Basic ConceptsReview from Last TimeChallenges Managing increasing device count Short lead time from conception to marketplace Process technology advances Device Performance Degradation Increasing variability Increasing pressure for cos
Iowa State - EE - 330
EE 330 Lecture 2Basic ConceptsQuiz 1The International Technology Roadmap for Semiconductors (ITRS) makes predictions on challenges and trends in the semiconductor industry. What is the ITRS projecting for the supply voltage of digital ICs in 10 years?
Iowa State - EE - 330
EE 330 Lecture 3Basic ConceptsHistorical Background, Feature Sizes and YieldReview from Last Time Sophisticated Integrated CAD Toolsets are extensively used in the industry to design integrated circuits Minimize the chances of an error Real asset to
Iowa State - EE - 330
EE 330 Lecture 3Basic ConceptsHistorical Background, Feature Sizes and YieldQuiz 2How many minimum-sized MOS transistors can be placed on a square die that is 1000 on a side in a 65nm process? (Neglect any bonding pads needed to get the signals to the
Iowa State - EE - 330
EE 330 Lecture 4Statistical ConceptsHistorical Background, Feature Sizes and Yield Digital Systems A previewReview from Last TimeDefects in a WaferDefect Dust particles and other undesirable processes cause defects Defects in manufacturing cause yie