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EE 330 Lect 12 Spring 2011

Course: EE 330, Fall 2011
School: Iowa State
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330 EE Lecture 12 Devices in Semiconductor Processes Quiz 11 A wire obtained with a ball bond is shown sitting on a bonding pad. What is a typical value for the dimension d1 shown? d1=? And the number is .... 1 8 3 5 4 6 9 7 2 And the number is .... 1 7 4 9 6 3 8 5 3 2 Quiz 11 A wire obtained with a ball bond is shown sitting on a bonding pad. What is a typical value for the dimension d1 shown?...

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330 EE Lecture 12 Devices in Semiconductor Processes Quiz 11 A wire obtained with a ball bond is shown sitting on a bonding pad. What is a typical value for the dimension d1 shown? d1=? And the number is .... 1 8 3 5 4 6 9 7 2 And the number is .... 1 7 4 9 6 3 8 5 3 2 Quiz 11 A wire obtained with a ball bond is shown sitting on a bonding pad. What is a typical value for the dimension d1 shown? d1=? d1=25 Review from Last Time Back-End Process Flow Wafer Probe Wafer Dicing Die Attach Wire Attach (bonding) Package Test Ship Review from Last Time Wafer Dicing www.renishaw.com Review from Last Time Die Attach 1. Eutectic 2. Pre-form 3. Conductive Epoxy Review from Last Time Electrical Connections (Bonding) Wire Bonding Bump Bonding Basic Semiconductor Processes MOS (Metal Oxide Semiconductor) 1. NMOS 2. PMOS 3. CMOS Basic Device: Niche Device: Other Devices: n-ch p-ch n-ch & p-ch MOSFET MESFET Diode BJT Resistors Capacitors Schottky Diode Basic Semiconductor Processes Bipolar 1. 2. 3. 4. T2L ECL I2L Linear ICs Basic Device: Niche Devices: Other Devices: BJT (Bipolar Junction Transistor) HBJT (Heterojunction Bipolar Transistor) HBT Diode Resistor Capacitor Schottky Diode JFET (Junction Field Effect Transistor) Basic Semiconductor Processes Other Processes Thin and Thick Film Processes Basic Device: Resistor BiMOS or BiCMOS Combines both MOS & Bipolar Processes Basic Devices: MOSFET & BJT SiGe BJT with HBT implementation SiGe / MOS Combines HBT & MOSFET technology SOI / SOS (Silicon on Insulator / Silicon on Sapphire) Twin-Well & Twin Tub CMOS Very similar to basic CMOS but more optimal transistor char. Devices in Semiconductor Processes Standard CMOS Process MOS Transistors n-channel p-channel Capacitors Resistors Diodes BJT ( decent in some processes) npn pnp n-channel p-channel JFET (in some processes) Standard Bipolar Process BJT npn pnp n-channel p-channel JFET Diodes Resistors Capacitors Niche Devices Photodetectors (photodiodes, phototransistors, photoresistors) MESFET HBT Schottky Diode (not Shockley) MEM Devices .... Basic Devices Standard CMOS Process MOS Transistors n-channel p-channel Primary Consideration in This Course Capacitors Diodes Resistors BJT (in some processes) npn pnp Niche Devices Photodetectors MESFET Schottky Diode (not Shockley) MEM Devices Triac/SCR .... Some Consideration in This Course Basic Devices and Device Models Resistor Diode Capacitor MOSFET BJT Basic Devices and Device Models Resistor Diode Capacitor MOSFET BJT Resistors were discussed when considering interconnects so will only be briefly reviewed here Resistors Generally thin-film devices Almost any thin-film layer can be used as a resistor Diffused resistors Poly Resistors Metal Resistors "Thin-film" adders (SiCr or NiCr) Subject to process variations, gradient effects and local random variations Often temperature and voltage dependent Ambient temperature Local Heating Nonlinearities often a cause of distortion when used in circuits Trimming possible resistors Laser,links,switches Resistor Model W d L V I Model: V R I Resistivity Volumetric measure of conduction capability of a material Area is A units : ohm cm AR L L R for homogeneous material, A, R, L Sheet Resistance W d L R RW R L ( for d << w, d << L ) units : ohms / for homogeneous materials, R is independent of W, L, R Relationship between and R RW R L AR L A R W A W d dxR A Wd R R W W Number of squares, NS, often used instead of L / W in determining resistance of film resistors R=RNS Example 1 W L R=? Example 1 L L NS W W Example 1 .4 8 7 6 5 4 3 2 1 R=? Example 1 .4 8 7 6 5 4 3 2 1 R=? NS=8.4 R = R (8.4) Corners in Film Resistors Corner Rule of Thumb: .55 squares for each corner Example 2 Determine R if R = 100 / Example 2 1 2 3 4 5 6 .55 1 2 3 1 2 3 4 5 6 7 .55 NS=17.1 R = (17.1) R R = 1710 Resistivity of Materials used in Semiconductor Processing Cu: Al: Gold: Platinum: n-Si: intrinsic Si: SiO2: 1.7E-6 cm 2.7E-4 cm 2.4E-6 cm 3.0E-6 cm .25 to 5 cm 2.5E5 cm E14 cm Temperature Coefficients Used for indicating temperature sensitivity of resistors & capacitors For a resistor: 1 dR TCR 106 ppm C R dT op. temp This diff eqn can easily be solved if TCR is a constant T2 T1 106 R T2 R T1 e TCR TCR R T2 R T1 1 T2 T1 6 10 Identical Expressions for Capacitors End of Lecture 12
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