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Wisconsin - ECE - 553
9/13/2011Overview Motivation Fault ModelingECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTES Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Transistor faults SummaryFault Modeling9/13/2011Motivati
Wisconsin - ECE - 553
9/20/2011Overview Problem and motivation Fault simulation algorithmsECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTESSerialParallelDeductiveConcurrentOther algorithms Random Fault Sampling SummaryFault Simulation9/20/2011Usages of Fault
Wisconsin - ECE - 553
9/27/2011OverviewECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTESStructural vs. functional testDefinitionsCompletenessConditions for finding a testAlgebrasTypes of Algorithms classicalComplexitySummaryAppendicesCombinational ATPG Basics
UGA - MATH - 2500
MATH 2550Midterm Exam September 22, 2006NAME (please print legibly): Please complete all 5 questions in the space provided. You may use the backs of the pages for extra space, or ask me for more paper if needed. Work carefully, and try to complete the p
UGA - MATH - 2500
MATH 2550Midterm Exam 2 November 8, 2006NAME (please print legibly): Please complete all 5 questions in the space provided. You may use the backs of the pages for extra space, or ask me for more paper if needed. Work carefully, and try to complete the p
UGA - MATH - 2500
MATH 2550Final Exam December 8, 2006NAME (please print legibly): Please complete all 10 questions in the space provided. You may use the backs of the pages for extra space, or ask me for more paper if needed. Work carefully, and try to complete the prob
Wisconsin - ECE - 553
9/30/2011OverviewMajor ATPG algorithms Definitions D-Algorithm (Roth) - 1966ECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTES D-cubes Bridging faults Logic gate function change faults PODEM (Goel) - 1981 X-Path-Check Backtracing SummaryC
Wisconsin - ECE - 553
10/6/2011Overview Motivation ATPG Systems Fault simulation effort Test generation effortECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTES Testability measures Purpose and origins SCOAP measures Combinational circuit example Sources of corr
Wisconsin - ECE - 553
10/11/2011OverviewECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTESMotivationSequential circuit ATPGAn example test generationTime-frame expansionNine-valued logicATPG implementation and drivabilityComplexity of ATPGCycle-free and cyclic ci
Wisconsin - ECE - 553
10/18/2011OverviewECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTESMotivation and introductionModel and fault modelTheoryChecking experiment designLimitations of the methodSummarySequential circuit testing Checking experiment approach10/18/
Wisconsin - ECE - 553
10/27/2011OverviewECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTESMotivation and introductionStructure independent approachStructure dependant approachOrganization/architecture dependantapproach Microprocessor testing Memory testing Summar
Wisconsin - ECE - 553
11/1/2011OverviewECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTESMemory testingMotivation and introductionFunctional model of a memoryA simple minded test and its limitationsFault modelsMarch tests and their capabilitiesNeighborhood testsS
Wisconsin - ECE - 553
11/11/2011OverviewHistory and motivationBasic principle Faults detected by IDDQ tests Instrumentation difficulties Sematech study Limitations of IDDQ testing SummaryECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTEMSIDDQ Current Testing11/1
Wisconsin - ECE - 553
11/11/2011Overview Definition Ad-hoc methods Scan designECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTEMSDesign for Testability (DFT) - 1Design rulesScan registerScan flip-flopsScan test sequencesOverheadScan design system Summary11/11
Wisconsin - ECE - 553
11/15/2011Overview: Partial-Scan & Scan VariationsECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTEMSDesign for Testability (DFT) - 2DefinitionPartial-scan architectureScan flip-flop selection methodsCyclic and acyclic structuresPartial-scan b
Wisconsin - ECE - 553
11/29/2011Overview: TPG and RCECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTEMSBuilt-In Self-Test (BIST) - 1Motivation and economicsDefinitionsBuilt-in self-testing (BIST) processBIST pattern generation (PG)BIST response compaction (RC)Alia
Wisconsin - ECE - 553
12/6/2011Overview: Logic BISTECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTEMSBuilt-In Self-Test (BIST) - 2MotivationBuilt-in Logic Block Observer (BILBO)Test / clock systemsTest / scan systemsCircular self-test path (CSTP) BISTCircuit init
Wisconsin - ECE - 553
12/9/2011Overview: Boundary ScanECE 553: TESTING ANDTESTABLE DESIGN OFDIGITAL SYSTEMSMotivationBed-of-nails testerSystem view of boundary scan hardwareElementary scan cellTest Access Port (TAP) controllerBoundary scan instructionsSummaryBounda
Wisconsin - ECE - 553
ECE 553: Testing and Testable Design of Digital SystemsDepartment of Electrical and Computer EngineeringUniversity of WisconsinMadisonECE 553: Testing and Testable Design of Digital SystemsFall 2010-2011Midterm ExaminationCLOSED BOOKDate:Place:Ti
Wisconsin - ECE - 553
ECE 553: Testing and Testable Design of Digital SystemsDepartment of Electrical and Computer EngineeringUniversity of WisconsinMadisonECE 553: Testing and Testable Design of Digital SystemsFall 2010-2011Midterm ExaminationSOLUTIONCLOSED BOOKDate:
Wisconsin - ECE - 553
ECE 553: Testing and Testable Design of Digital Systems0.4pt0.4pt 0pt0.4ptDepartment of Electrical and Computer EngineeringUniversity of WisconsinMadisonECE 553: Testing and Testable Design of Digital SystemsFall 2011-2012Midterm ExaminationCLOSED
Wisconsin - ECE - 553
ECE 553: Testing and Testable Design of Digital Systems0.4pt0.4pt 0pt0.4ptDepartment of Electrical and Computer EngineeringUniversity of WisconsinMadisonECE 553: Testing and Testable Design of Digital SystemsFall 2011-2012Midterm ExaminationCLOSED
Wisconsin - ECE - 553
ECE 553: Testing and Testable Design of Digital Systems0.4pt0.4pt 0pt0.4ptDepartment of Electrical and Computer EngineeringUniversity of WisconsinMadisonECE 553: Testing and Testable Design of Digital SystemsFall 2011Final Examination - SyllabusDat
Wisconsin - ECE - 553
ECE 553: Testing and Testable Design of Digital Systems0.4pt0.4pt 0pt0.4ptDepartment of Electrical and Computer EngineeringUniversity of WisconsinMadisonECE 553: Testing and Testable Design of Digital SystemsFall 2011Midterm Examination - SyllabusD
Shanghai Normal University - LAW - 448
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