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AUTOMATED MEASUREMENT OF SEMICONDUCTOR DEVICE CHARACTERISTICS FOR COMPUTER-ASSISTED ELECTRONIC DESIGN Mustafa G. Guvench University of Southern Maine Abstract This paper describes two new techniques that facilitate measurement of input, output and transfer characteristics of semiconductor devices in an instructional electronics laboratory for the purpose of determining their SPICE parameters for computer-assisted electronic design. The techniques utilize standard features of GPIB controlled digital multimeters and waveform generators to do the simultaneous measurement of current and voltage. They are affordable because only one meter is required to collect the terminal i-v data. One of them also allows true common-terminal measurements, i.e., common-emitter, common-source, etc. The techniques have already been tested and incorporated into the junior electronics laboratory experiments at the University of Southern Maine. 1.INTRODUCTION Acceptance of SPICE in the electronics industry as the standard tool for simulating electronic circuits, its recent migration into the electrical engineering curricula through new textbooks[1-4] and educational software[5,6], ABET requirement to emphasize "design experience" in the undergraduate engineering programs and wider utilization of electronic design automation tools in the electronics industry have created a need to give the electrical engineering student a better understanding of and experience with semiconductor device characterization and modeling. SPICE is a very powerful circuit analysis and simulation tool and constitutes the core of most computer aided circuit analysis/design packages. However, just like any system simulation program, the closeness of its predictions and the actual response of a system is ultimately limited by the accuracy of the model parameters it is supplied with as well as how good the models are. Inaccuracy or inadequacy of the model parameters supplied for the components of the circuit cannot be corrected by the simulator. ... View Full Document

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