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School: Purdue
EE650R: Lecture 28: Date: ClassNotes: Reviewer: Reliability Physics of Nanoelectronic Devices Hot Carrier Injection Summary of experimental observations Dec. 01, 2006 Haldun Kufluoglu Vijay Rawat 32.1- Background and Mechanism Hot carrier injection is ano
School: Purdue
EE650R: Reliability Physics of Nanoelectronic Devices Lecture 14: NBTICharacteriz ation T echniques- shift Measurem ent Vt Oct. 2006 13, Date: Class Notes: Dennis ( Han Chung)Lin Review: Ninad Pim parkar 14. Review/ 1 Background In the previous lectures v
School: Purdue
EE650R: Reliability Physics of Nanoelectronic Devices Lecture 15: Negative Bias Temperature Instability Date: Oct. 16th, 2006 ClassNotes: Haldun Kufluoglu Review: Vijay Rawat 16.1 Review/Background The interface trap densities created due to broken Si:H b
School: Purdue
EE650R: Lecture 5: Date: ClassNotes: Review: Reliability Physics of Nanoelectronic Devices Statistical Projection Sep 20, 2006 Jing Li Jaydeep P. Kulkarni 5.1 Review/Background In discussing the BFRW problem, we mentioned that viable reliability tests mus
School: Purdue
EE650R: Lecture 8: Date: Class Notes: Reviewed by: Reliability Physics of Nanoelectronic Devices Negative Bias Temperature Instability Sep 27 2006 Vijay Rawat Saakshi Gangwal 8.0 Negative Bias Temperature Instability (NBTI) It has been seen in the case of
School: Purdue
EE650R: Lecture 28: Date: ClassNotes: Reviewer: Reliability Physics of Nanoelectronic Devices Hot Carrier Injection Summary of experimental observations Dec. 01, 2006 Haldun Kufluoglu Vijay Rawat 32.1- Background and Mechanism Hot carrier injection is ano
School: Purdue
EE650R: Reliability Physics of Nanoelectronic Devices Lecture 14: NBTICharacteriz ation T echniques- shift Measurem ent Vt Oct. 2006 13, Date: Class Notes: Dennis ( Han Chung)Lin Review: Ninad Pim parkar 14. Review/ 1 Background In the previous lectures v
School: Purdue
EE650R: Reliability Physics of Nanoelectronic Devices Lecture 15: Negative Bias Temperature Instability Date: Oct. 16th, 2006 ClassNotes: Haldun Kufluoglu Review: Vijay Rawat 16.1 Review/Background The interface trap densities created due to broken Si:H b
School: Purdue
EE650R: Lecture 5: Date: ClassNotes: Review: Reliability Physics of Nanoelectronic Devices Statistical Projection Sep 20, 2006 Jing Li Jaydeep P. Kulkarni 5.1 Review/Background In discussing the BFRW problem, we mentioned that viable reliability tests mus
School: Purdue
EE650R: Lecture 8: Date: Class Notes: Reviewed by: Reliability Physics of Nanoelectronic Devices Negative Bias Temperature Instability Sep 27 2006 Vijay Rawat Saakshi Gangwal 8.0 Negative Bias Temperature Instability (NBTI) It has been seen in the case of
School: Purdue
EE650R: Reliability Physics of Nanoelectronic Devices Lecture 32: Summary of Reliability for Nano-electronics Devices Date: Dec 8, 2006 Class Notes: Animesh Datta 32.0 Review So far, in this course we have discussed some of the major reliability concerns
School: Purdue
Course: Digital Signal Processing I
EE538 Final Exam Digital Signal Processing I Cover Sheet Fall 2001 12 December 2001 Test Duration: 2 hours. Open Book but Closed Notes. Calculators not allowed. This test contains ve problems. All work should be done in the blue books provided. You must s
School: Purdue
EE650R: Lecture 28: Date: ClassNotes: Reviewer: Reliability Physics of Nanoelectronic Devices Hot Carrier Injection Summary of experimental observations Dec. 01, 2006 Haldun Kufluoglu Vijay Rawat 32.1- Background and Mechanism Hot carrier injection is ano
School: Purdue
EE650R: Reliability Physics of Nanoelectronic Devices Lecture 14: NBTICharacteriz ation T echniques- shift Measurem ent Vt Oct. 2006 13, Date: Class Notes: Dennis ( Han Chung)Lin Review: Ninad Pim parkar 14. Review/ 1 Background In the previous lectures v
School: Purdue
EE650R: Reliability Physics of Nanoelectronic Devices Lecture 15: Negative Bias Temperature Instability Date: Oct. 16th, 2006 ClassNotes: Haldun Kufluoglu Review: Vijay Rawat 16.1 Review/Background The interface trap densities created due to broken Si:H b
School: Purdue
EE650R: Lecture 5: Date: ClassNotes: Review: Reliability Physics of Nanoelectronic Devices Statistical Projection Sep 20, 2006 Jing Li Jaydeep P. Kulkarni 5.1 Review/Background In discussing the BFRW problem, we mentioned that viable reliability tests mus
School: Purdue
EE650R: Lecture 8: Date: Class Notes: Reviewed by: Reliability Physics of Nanoelectronic Devices Negative Bias Temperature Instability Sep 27 2006 Vijay Rawat Saakshi Gangwal 8.0 Negative Bias Temperature Instability (NBTI) It has been seen in the case of
School: Purdue
EE650R: Reliability Physics of Nanoelectronic Devices Lecture 32: Summary of Reliability for Nano-electronics Devices Date: Dec 8, 2006 Class Notes: Animesh Datta 32.0 Review So far, in this course we have discussed some of the major reliability concerns
School: Purdue
EE650R: Lecture 28: Date: ClassNotes: Review: Reliability Physics of Nanoelectronic Devices Intrinsic vs. Extrinsic TDDB: Theory of pre-existing damage Nov 27th 2006 Han Chung Lin (Dennis) Ninad V. Pimparkar 28.1 Review In the last two classes, we discuss
School: Purdue
Course: Digital Signal Processing I
EE538 Final Exam Digital Signal Processing I Cover Sheet Fall 2001 12 December 2001 Test Duration: 2 hours. Open Book but Closed Notes. Calculators not allowed. This test contains ve problems. All work should be done in the blue books provided. You must s
School: Purdue
Course: Digital Signal Processing I
Digital Signal Processing I In-Class Exam 3 Fall 2005 Live: 2 Dec. 2005 Cover Sheet Test Duration: 55 minutes. Open Book but Closed Notes. Calculators allowed. This test contains three problems. All work should be done in the blue books provided. Do not r
School: Purdue
Course: Signals And Systems
EE301 Signals and Systems Exam 1 In-Class Exam Tuesday, Feb. 24, 2009 Cover Sheet Test Duration: 75 minutes. Coverage: Chaps. 1,2,3 Open Book but Closed Notes. Calculators NOT allowed. This test contains two problems. All work should be done in the blue b
School: Purdue
Course: Signals And Systems
NAME: EE301 Signals and Systems 26 September 2013 Exam 1 Cover Sheet Test Duration: 75 minutes. Coverage: Chaps. 1,2 Open Book but Closed Notes. One 8.5 in. x 11 in. crib sheet Calculators NOT allowed. This test contains two problems. All work should be d
School: Purdue
Course: Signals And Systems
Name: ECE301 Signals and Systems Final Exam Monday, Dec. 9, 2013 Cover Sheet Write your name on this page and every page to be safe. Test Duration: 120 minutes. Coverage: Comprehensive Open Book but Closed Notes. Three two-sided handwritten sheets. Calcul
School: Purdue
Course: Signals And Systems
NAME: EE301 Signals and Systems 13 February 2013 Exam 1 Cover Sheet Test Duration: 75 minutes. Coverage: Chaps. 1,2 Open Book but Closed Notes. One 8.5 in. x 11 in. crib sheet Calculators NOT allowed. This test contains two problems. All work should be do
School: Purdue
Course: Signals And Systems
5 pt 5 pt 9 pt 9 pt 4 pt 3 pt 15 pt 10 pt 15 pt 5 pt 5 pt 5 pt 5 pt 5 pt
School: Purdue
Course: Digital Signal Processing
EE 438 Homework 8, due Friday, 10/12/2001. Problem 1. Circulant matrices: Linear systems invariant to a circular shift. Note that a substantial portion of this problem was done in class. Consider a linear system which takes an N -periodic signal as an inp
School: Purdue
Course: Digital Signal Processing
NAME:_ EE 438 Exam 1 Solutions, 9/24/2001. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. Total number of points: 120. This exam counts for 12% of your nal grade. You have 50 minutes to complete FOUR problems.
School: Purdue
Course: Digital Signal Processing
NAME:_ EE 438 Exam 2 Solutions, 10/19/2001. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. Total number of points: 120. This exam counts for 12% of your nal grade. You have 50 minutes to complete FIVE problems.
School: Purdue
Course: Digital Signal Processing
NAME:_ EE 438 Exam 3 Solutions, 11/16/2001. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. Total number of points: 120. This exam counts for 12% of your nal grade. You have 50 minutes to complete FOUR problems.
School: Purdue
Course: Digital Signal Processing
NAME:_ EE 438 Final Exam Solutions, 12/11/2001. This is a closed-book exam, but you are allowed three standard (8.5-by-11) sheets of notes. Total number of points: 190. This exam counts for 19% of your course grade. You have two hours to complete FIVE
School: Purdue
Course: Digital Signal Processing With Applications
NAME:_ ECE 438 Exam 1 Solutions, 10/05/2005. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. No calculators are allowed. Total number of points: 100. This exam counts for 20% of your nal grade. You have 75 minut
School: Purdue
Gate Oxide Reliability: Physical and Computational Models Andrea Ghetti 1 Introduction Since its birth, the microelectronics industry has been characterized by the continuous struggle to nd new technological processes that allow the reduction of the physi
School: Purdue
EE650R: Lecture 28: Date: ClassNotes: Reviewer: Reliability Physics of Nanoelectronic Devices Hot Carrier Injection Summary of experimental observations Dec. 01, 2006 Haldun Kufluoglu Vijay Rawat 32.1- Background and Mechanism Hot carrier injection is ano
School: Purdue
EE650R: Reliability Physics of Nanoelectronic Devices Lecture 14: NBTICharacteriz ation T echniques- shift Measurem ent Vt Oct. 2006 13, Date: Class Notes: Dennis ( Han Chung)Lin Review: Ninad Pim parkar 14. Review/ 1 Background In the previous lectures v
School: Purdue
EE650R: Reliability Physics of Nanoelectronic Devices Lecture 15: Negative Bias Temperature Instability Date: Oct. 16th, 2006 ClassNotes: Haldun Kufluoglu Review: Vijay Rawat 16.1 Review/Background The interface trap densities created due to broken Si:H b
School: Purdue
EE650R: Lecture 5: Date: ClassNotes: Review: Reliability Physics of Nanoelectronic Devices Statistical Projection Sep 20, 2006 Jing Li Jaydeep P. Kulkarni 5.1 Review/Background In discussing the BFRW problem, we mentioned that viable reliability tests mus
School: Purdue
EE650R: Lecture 8: Date: Class Notes: Reviewed by: Reliability Physics of Nanoelectronic Devices Negative Bias Temperature Instability Sep 27 2006 Vijay Rawat Saakshi Gangwal 8.0 Negative Bias Temperature Instability (NBTI) It has been seen in the case of
School: Purdue
EE650R: Reliability Physics of Nanoelectronic Devices Lecture 32: Summary of Reliability for Nano-electronics Devices Date: Dec 8, 2006 Class Notes: Animesh Datta 32.0 Review So far, in this course we have discussed some of the major reliability concerns
School: Purdue
EE650R: Lecture 28: Date: ClassNotes: Review: Reliability Physics of Nanoelectronic Devices Intrinsic vs. Extrinsic TDDB: Theory of pre-existing damage Nov 27th 2006 Han Chung Lin (Dennis) Ninad V. Pimparkar 28.1 Review In the last two classes, we discuss
School: Purdue
Overview of Circuit Simulation Programs ECE 546 DIGITAL COMPUTATIONAL TECHNIQUES FOR ELECTRONIC CIRCUITS January 10, 2005 Oleg Wasynczuk Need for System-of-Subsystems Approach Complex engineered systems such as aircraft, modern automobiles, or the terrest
School: Purdue
Course: Digital Signal Processing I
EE538 Final Exam Digital Signal Processing I Cover Sheet Fall 2001 12 December 2001 Test Duration: 2 hours. Open Book but Closed Notes. Calculators not allowed. This test contains ve problems. All work should be done in the blue books provided. You must s
School: Purdue
Course: Digital Signal Processing I
Digital Signal Processing I In-Class Exam 3 Fall 2005 Live: 2 Dec. 2005 Cover Sheet Test Duration: 55 minutes. Open Book but Closed Notes. Calculators allowed. This test contains three problems. All work should be done in the blue books provided. Do not r
School: Purdue
Course: Signals And Systems
EE301 Signals and Systems Exam 1 In-Class Exam Tuesday, Feb. 24, 2009 Cover Sheet Test Duration: 75 minutes. Coverage: Chaps. 1,2,3 Open Book but Closed Notes. Calculators NOT allowed. This test contains two problems. All work should be done in the blue b
School: Purdue
Course: Signals And Systems
NAME: EE301 Signals and Systems 26 September 2013 Exam 1 Cover Sheet Test Duration: 75 minutes. Coverage: Chaps. 1,2 Open Book but Closed Notes. One 8.5 in. x 11 in. crib sheet Calculators NOT allowed. This test contains two problems. All work should be d
School: Purdue
Course: Signals And Systems
Name: ECE301 Signals and Systems Final Exam Monday, Dec. 9, 2013 Cover Sheet Write your name on this page and every page to be safe. Test Duration: 120 minutes. Coverage: Comprehensive Open Book but Closed Notes. Three two-sided handwritten sheets. Calcul
School: Purdue
Course: Signals And Systems
NAME: EE301 Signals and Systems 13 February 2013 Exam 1 Cover Sheet Test Duration: 75 minutes. Coverage: Chaps. 1,2 Open Book but Closed Notes. One 8.5 in. x 11 in. crib sheet Calculators NOT allowed. This test contains two problems. All work should be do
School: Purdue
Course: Signals And Systems
5 pt 5 pt 9 pt 9 pt 4 pt 3 pt 15 pt 10 pt 15 pt 5 pt 5 pt 5 pt 5 pt 5 pt
School: Purdue
Course: Digital Signal Processing
NAME:_ EE 438 Exam 1 Solutions, 9/24/2001. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. Total number of points: 120. This exam counts for 12% of your nal grade. You have 50 minutes to complete FOUR problems.
School: Purdue
Course: Digital Signal Processing
NAME:_ EE 438 Exam 2 Solutions, 10/19/2001. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. Total number of points: 120. This exam counts for 12% of your nal grade. You have 50 minutes to complete FIVE problems.
School: Purdue
Course: Digital Signal Processing
NAME:_ EE 438 Exam 3 Solutions, 11/16/2001. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. Total number of points: 120. This exam counts for 12% of your nal grade. You have 50 minutes to complete FOUR problems.
School: Purdue
Course: Digital Signal Processing
NAME:_ EE 438 Final Exam Solutions, 12/11/2001. This is a closed-book exam, but you are allowed three standard (8.5-by-11) sheets of notes. Total number of points: 190. This exam counts for 19% of your course grade. You have two hours to complete FIVE
School: Purdue
Course: Digital Signal Processing With Applications
NAME:_ ECE 438 Exam 1 Solutions, 10/05/2006. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. No calculators are allowed. Total number of points: 50. This exam counts for 20% of your nal grade. You have 75 minute
School: Purdue
Course: Digital Signal Processing With Applications
NAME:_ ECE 438 Exam 1 Solutions, 10/06/2004. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. No calculators are allowed. Total number of points: 105; in addition, 10 bonus points will be awarded for getting 100%
School: Purdue
Course: Digital Signal Processing With Applications
NAME:_ ECE 438 Exam 1 Solutions, 10/08/2003. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. No calculators are allowed. Total number of points: 120. This exam counts for 20% of your nal grade. You have 75 minut
School: Purdue
Course: Digital Signal Processing With Applications
NAME:_ ECE 438 Exam 2 Solutions, 11/08/2006. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. No calculators are allowed. Total number of points: 50. This exam counts for 20% of your nal grade. You have 75 minute
School: Purdue
Course: Digital Signal Processing With Applications
NAME:_ ECE 438 Exam 2 Solutions, 11/16/2004. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. No calculators are allowed. Total number of points: 110; in addition, 10 bonus points will be awarded for getting at le
School: Purdue
Course: Digital Signal Processing With Applications
NAME:_ ECE 438 Exam 2 Solutions, 11/19/2003. This is a closed-book exam, but you are allowed one standard (8.5-by-11) sheet of notes. No calculators are allowed. Total number of points: 120. This exam counts for 20% of your nal grade. You have 75 minut
School: Purdue
Course: Digital Signal Processing With Applications
NAME:_ ECE 438 Final Exam Solutions, 12/12/2006. This is a closed-book exam, but you are allowed two standard (8.5-by-11) sheets of notes. No calculators are allowed. Total number of points: 100. This exam counts for 32% of your nal grade. You have two
School: Purdue
Course: Digital Signal Processing With Applications
NAME:_ ECE 438 Final Exam Solutions, 12/13/2005. This is a closed-book exam, but you are allowed two standard (8.5-by-11) sheets of notes. No calculators are allowed. Total number of points: 100. This exam counts for 32% of your nal grade. You have 120
School: Purdue
Course: Digital Signal Processing With Applications
NAME:_ ECE 438 Final Exam Solutions, 12/14/2004. This is a closed-book exam, but you are allowed two standard (8.5-by-11) sheets of notes. No calculators are allowed. Total number of points: 135. This exam counts for 25% of your nal grade. You have 120
School: Purdue
Course: Digital Signal Processing With Applications
NAME:_ ECE 438 Final Exam Version 1 Solutions, 12/16/2003. This is a closed-book exam, but you are allowed two standard (8.5-by-11) sheets of notes. No calculators are allowed. Total number of points: 150. This exam counts for 25% of your nal grade. Yo
School: Purdue
Course: Digital Signal Processing
NAME: NAME EE301 Signals and Systems In-Class Exam Exam 3 Wednesday, Apr. 17, 2013 Cover Sheet Test Duration: 60 minutes. Coverage: Chaps. 5,7 Open Book but Closed Notes. One 8.5 in. x 11 in. crib sheet Calculators NOT allowed. All work should be done on
School: Purdue
Course: Digital Signal Processing
Name: ECE301 Signals and Systems Final Exam Friday, May 3, 2013 Cover Sheet Write your name on this page and every page to be safe. Test Duration: 120 minutes. Coverage: Comprehensive Open Book but Closed Notes. Four two-sided handwritten sheets. Calculat
School: Purdue
Course: Digital Signal Processing
14 February 2003 EE 438 Name:_ Exam No. 1 Spring 2003 You have 50 minutes to work the following four problems. Be sure to show all your work to obtain full credit. The exam is closed book and closed notes. Calculators are permitted. 1. (25 pts.) Consider
School: Purdue
Course: Digital Signal Processing
DSP With Applications Exam 1 9 Feb. 2001 Problem 1. [35 points] The continuous time signal xa (t) with CTFT plotted below X a (f) 1 -4000 -3000 3000 4000 f (Hz) is sampled at a rate fs = 8 KHz to produce the discrete-time signal x(n), i.e., x(n) = xa (n/f
School: Purdue
Course: Digital Signal Processing
EE438 DSP With Applications Exam 2 9 March 2001 Problem 1. [30 points] Consider the following two N = 16 point sequences: n cfw_u(n) u(n 16) 2 x(n) = cos and 1n h(n) = cfw_u(n) u(n 16), 2 where u(n) is the DT unit step function. Let X16 (k ) and H16 (k )
School: Purdue
Course: Digital Signal Processing
EE438 DSP With Applications Exam 3 18 April 2001 Problem 1. [30 points] Let sn (m) be a windowed speech segment of length N which is nonzero for 0 m N 1. The energy of the segment is determined to be unity, i.e., N 1 s2 (m) = 1 n m=0 N +p1 In addition, th
School: Purdue
School: Purdue
School: Purdue
NAME:_ EE 302 Division 1 MWF 3:30-4:20 (Prof. Pollak) Final Exam Solutions, 4/29/2002. This is a closed-book exam. A formula sheet is provided. No calculators are allowed. You have two hours to complete FOUR problems. Be sure to fully and clearly
School: Purdue
Course: Digital Signal Processing
EE 438 Homework 8, due Friday, 10/12/2001. Problem 1. Circulant matrices: Linear systems invariant to a circular shift. Note that a substantial portion of this problem was done in class. Consider a linear system which takes an N -periodic signal as an inp
School: Purdue
Course: Digital Signal Processing With Applications
ECE 438 Homework 9, due in class Friday, 10/28/2005. Problem 1. Let X (n) be a wide-sense stationary sequence of random variables with zero mean and autocorrelation function 1, |n| 1 rXX (n) = 0, otherwise. Suppose this sequence is ltered to generate the
School: Purdue
Course: Electronic Circuit Analysis
ECE 255 ELECTRONIC ANALYSIS AND DESIGN Homework 2 Solutions Spring 2013 Problem 1 (Text 3.74) Find the Q-points for the diodes in the four circuits shown using: (a) The ideal diode model (a) Both diodes are forward biased [ 0 (6)] V = 140 A I D2 = 43k (9
School: Purdue
Course: Electronic Circuit Analysis
ECE 255 ELECTRONIC ANALYSIS AND DESIGN Homework 1 Solutions Spring 2013 Problem 1 (Text 2.14) (a) A silicon sample is supporting an electric field of 2000 V/cm, and the mobilities of electrons and holes are 1000 and 400 cm2/V-s, respectively. What are the
School: Purdue
Course: Electronic Circuit Analysis
ECE 255 ELECTRONIC ANALYSIS AND DESIGN Homework 3 Solutions Spring 2013 Problem 1 (Text 5.88) Find the Q-point for the circuit shown below if R1 = 120 k, R2 = 270 k, RE = 100 k, RC = 150 k, F = 100, VBE = 0.7 V, and the positive power supply voltage is 15
School: Purdue
Course: Electronic Circuit Analysis
ECE 255 ELECTRONIC ANALYSIS AND DESIGN Homework 4 Solutions Problem 1 (Text 13.65) Spring 2013 Compute AVs The ac equivalent circuit for an amplifier is shown. Assume the capacitors have infinite value and that RS = 750 , RB = 100 k, RC = 100 k, and R3 =
School: Purdue
Course: Electronic Circuit Analysis
ECE 255 ELECTRONIC ANALYSIS AND DESIGN Homework 5 Solutions Spring 2013 Problem 1 The FET in the circuit below is characterized by |IDSS| = 22.5 mA and |VP| = 3.6 V. Determine suitable values for the external circuit elements to obtain an operating point
School: Purdue
Course: Electronic Circuit Analysis
ECE 255 ELECTRONIC ANALYSIS AND DESIGN Homework 6 Solutions Spring 2013 Problem 1 An FET in an electronic kit is to be biased as in the circuit shown below with the specified component values. The FET is characterized by VT = 3 V , K = 9 m A , and a Beyon
School: Purdue
School: Purdue
EE544: Digital Communications HW1 (Fall 2002) (due on Class 4) 1. A communication system is shown in Fig. 1. Let s(t) = b0 PT (t), where b0 {1, 1} and PT (t) = 1 0 if 0 t < T, elsewhere. The thermal noise n(t) is an additive white Gaussian noise w