Unformatted text preview: SEMs to SIMS. An electron and a Mg2+ ion are moving from a surface in vacuum towards a detector 1m away with a uniform speed of 100 m/s. Calculate the acceleration on the electron and the ion when subjected to (a) 1 Kilovolt attractive electric field bias in the direction of its motion (b) A 1 tesla magnetic field perpendicular to its direction of motion. In each case specify how the fields will alter the direction of the electron and the ion. 4) Draw the contact mode AFM image (rough sketch with dimensions) of the structure drawn below when using a tip with radius of curvature (a) 1nm and (b) 1 micron. Briefly explain your rationale. 50 nm wide 500 nm tall (nanowire)...
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- Spring '08
- Electron, Magnetic Field, Scanning Electron Microscopy, kev scanning electron, KeV ion microscopy