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Unformatted text preview: ( i ) G sa1 ( ii ) J sa1 ( iii) A sa0 4) Find a set of minimum number of flipflops that should be scanned so that the circuit below becomes a balanced pipeline. 5) Consider the scan design shown below. For the case listed below, determine the best way, among together and overlap mode, to organize the testing of the blocks C1, C2, & C3 to minimize the test time. Explain your reasoning. Assume C1 requires 6 test vectors, C2 requires 10 test vectors, and C3 requires 2 test vectors....
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This test prep was uploaded on 04/22/2008 for the course EE 1 taught by Professor Dsd during the Fall '03 term at University of Iowa.
 Fall '03
 dsd

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