Examsoln2 - 55:138 Testing of Digital Logic Circuits EXAM 2...

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Unformatted text preview: 55:138 Testing of Digital Logic Circuits 4/18/02 EXAM 2 S.M.Reddy 1) A single cell of the ILA model of asynchronous sequential circuit using three D flip-flops is shown below. For this circuit 1, 2, 3, 4 are the primary inputs, 5,6 and 7 are present state variables q1, q2, q3 and 15,24 and 25 are the next state variables Q1, 02 and Q3 respectively. The output is line 26 3) Find a self-initializing test forthe fault line 14 stuck-at—l. b) Find a test for line 14 stuck-a-O assuming that the initial state is q1 - l, q;. l , q3 - l. To atl:\\)o\:e \AS-Ofls—D m. l 7 " \t-‘s @ \A—>\é——>\‘l-77.o Aé-lo')q,‘(——o I l ' \é—‘i 63) M anew-pm 44. 'o , Opt/:0 , I L\4 -—>\6.>lfi-77_o l AX _\/ Q\:o Pl. eqpamq (who fig \A34.\;g4i‘\134 T¢-\‘..‘x\)r‘7(xax‘yx X T90" ‘ V" \X%o'\\ xo 2) For the circuit shown below determine the AND bridging faults detected by the test shown. Also identify oscillating faults if any. O ‘ ' is b s-a-o ,911: 70 r ‘ (DeteeX-eg “‘6? W739 sci-o 3mm; mm“ W“ v® ; C &,e, ‘9/M -g . \D is on (siltlcag M43- V‘ \ I C ) V “345% $353: film mow“ on (bf/av >osci09ab'3 (lye) V |./ Ule com (6") V was. (GUM V (b,m / (Aw-0) 7‘ (’9‘ g m3? “:2: Die)“ ::/e v (321%) V OWN) 7‘ “(flogging 3) Find 11m probability 0:“‘1 nn mgh 13m in the circuit given below, assuming the prm‘mbjiily of} Mn imms is 1/2. we) 7. 1 \- qu-J) (‘92)):1 ‘pCh:\)~.\-— 4; “5‘” ” “% i=1 4 m‘ ¥CX-O) : Pckzo \b: 3 .\ , 1 97:35“ 3:3:- ‘P(m=\) C \-— nglzo): \ ’3—2\ “'1. 4) Dcrivc :1 Pseudo-Exhausti w 1; \1 s- or the circuit shown below using the partitions shown The blwsks ofthc g); Him}: we enclosed in dashed rectangles. ...
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Examsoln2 - 55:138 Testing of Digital Logic Circuits EXAM 2...

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