ENGRI111_26_AFM - Scanning Probe Microscopy Features Common...

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ENGRI_111 10/29/2007 Scanning Probe Microscopy Features Common between STM and AFM: •Scan range: 200 x 200 micron lateral, 10 micron vertical •Some vibration isolation required •Scan rates: 10 nm/sec to 1000 nm/sec typical 512x512 pixels at 512 pixels/sec Scanning Tunneling Microscopy (STM) Conductive samples (sustain ~50 pA at ~1 V) •Lateral resolution (tip dependent): as small as ~0.1 nm •Vertical resolution: ~0.01 nm •Image in air or vacuum Atomic Force Microscopy (AFM) •Insulating, conductive, magnetic samples •Lateral resolution (tip dependent):typically ~10 nm •Vertical resolution: typically 0.03 nm •Image in air, vacuum, fluids
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ENGRI_111 10/29/2007
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ENGRI_111 10/29/2007 Scanning Probe Microscopy Technology Basic Instrumentation Vibration Isolation •Internal spring systems •Rigid, compact design •External air pistons Nanometer Scanner •Piezoceramic tubes, rods •Hysteresis unavoidable Sample Approach Nanometer steps over mm distances! •Mechanical screws •Piezoceramic actuators Vintage 1988 STM
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ENGRI_111 10/29/2007 Mo ve m e nt  o f  c a ntile ve r  is   m o nito re d,  us ua lly  b y  b o unc ing   a   la s e r  o ff  the   b a c k  o f  the   c a ntile ve r  into   a   de te c to r.  De pe nding   o f  the   ”s o ftne s s ”  o f  the   c a ntile ve r,  S FM  c a n  de te c t 
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ENGRI111_26_AFM - Scanning Probe Microscopy Features Common...

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