1Christopher ‘Kit’ UmbachDept. of Materials Science and EngineeringResearch InterestsScanned probe techniquesSTM, AFM, NSOM, Combined AFM/fluorescence, Tip-enhancedRaman & FluorescenceMorphology of glass surfacesNanoporous metalsManager of NBTC AFM facility and CCMR Molecular and CellularSurface Imaging (MOCSI) facilityScanned Probe MicroscopyCapability: Revolutionary ToolSPM makes nanoscale characterization commonplaceSPM’s are ubiquitous at Cornell•4 in facilities (CCMR Materials & MOCSI, NBTC, CNF)•>15 instruments in individual research labsWide range of commercial instruments (not an exclusive list!)•Digital Instruments (Veeco Metrology) (www.di.com)•RHK (www.rhk-tech.com)•Omicron (www.omicron-instruments.com)•JEOL (www.jeol.com)•Molecular Imaging (Agilent) (www.molec.com)Ease of use•Graduate students trained within two hours•10 minutes from sample loading to imagingCost of entry low (compared to SEM or TEM)•$35K for simplest instrument•$500K for ultra-high vacuum system
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2Capability: SpecificationsFeatures Common between STM and AFM:•Scan range: 200 x 200 micron lateral, 10 to 70 micron vertical•Image in air, fluids, inert gas, vacuum•Some vibration isolation required•Scan rates: 10 nm/sec to 1000 nm/sectypical 512x512 pixels at 512 pixels/secScanning Tunneling Microscopy (STM)•Conductive samples (sustain ~50 pA at ~1 V)•Lateral resolution (tip dependent): as small as ~0.1 nm•Vertical resolution: ~0.01 nmScanning Force Microscopy (SFM)•Insulating, conductive, magnetic samples•Up to 200 mm diameter samples, 12 mm thick(for commercial instruments with lower vertical resolution)•Lateral resolution (tip dependent):typically ~10 nm•Vertical resolution: typically 0.03 nmCapability:Pick Your AcronymOperating Modes of DI Dimension 3100 SPM:Contact ModeTappingMode TMNon-contact ModeLiftMode™PhaseImaging™Lateral Force Microscopy (LFM)Magnetic Force Microscopy (MFM)Force ModulationElectric Force Microscopy (EFM)Surface Potential Microscopy (SPoM)Scanning Capacitance Microscopy (SCM)Scanning Spreading Resistance Microscopy(SSRM)Tunneling Atomic Force MicroscopyConductive Atomic Force MicroscopyScanning Tunneling Microscopy (STM)Scanning Thermal Microscopy (SThM)NanoindentingTopographyMetrologyMechanical propertiesHardnessElastic modulusSpatial variations in modulusElectrical propertiesSpatially resolved I-V curvesand surface potentialMagnetic heterogeneitiesNo elemental identificationDIDI