C-AFM_Slides[1]

C-AFM_Slides[1] - by Moutinho Solar Cell Experiment...

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Conductive Atomic-Force Microscopy Applied to CdTe/CdS Solar Cells Purpose: Measure the current between the tip and sample surface, and obtain high resolution images of polycrystalline materials Materials: Glass/SnO 2 /CdS/CdTe Procedure: Scanning probe microscope (contact mode) applies positive or negative voltage through the tip Image taken from C-AFM applied to Solar Cells by Moutinho
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Solar Cell Experiment Results As Deposited Nitric/phosphoric acid etch Bromine/methanol etch After CdCl 2 treatment Images taken from C-AFM applied to Solar Cells
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Unformatted text preview: by Moutinho Solar Cell Experiment Accomplishments • Review: • NP etch caused an increase in conductivity over the entire surface • Change in the contact from rectifying to ohmic • Conclusion: • NP etches are more suitable than BM etches for fabricating ohmic contacts in CdTe/CdS solar cells • NP etches increase the efficiency of CdTe/CdS solar cells • Application of the Conductive atomic-force microscopy Image taken from C-AFM applied to Solar Cells by Moutinho...
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This note was uploaded on 04/09/2009 for the course MSE 111 taught by Professor Giannelis during the Fall '07 term at Cornell.

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C-AFM_Slides[1] - by Moutinho Solar Cell Experiment...

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