Nanotechnology presentation - limit. The AFM was invented...

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Nanotechnology presentation Atomic Force Microscopy The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high-resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction
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Unformatted text preview: limit. The AFM was invented by Binnig, Quate and Gerber in 1986, and is one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale.
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This note was uploaded on 04/09/2009 for the course MSE 111 taught by Professor Giannelis during the Fall '07 term at Cornell University (Engineering School).

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