Unformatted text preview: limit. The AFM was invented by Binnig, Quate and Gerber in 1986, and is one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale. http://en.wikipedia.org/wiki/Atomic_force_microscope...
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- Fall '07
- Gerber, Scanning probe microscopy, atomic force microscope, Nanotechnology presentation Atomic