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Presentation_Notes - Conductive Atomic Force Microscopy...

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Conductive Atomic Force Microscopy Applied to CdTe/CdS Solar Cells: Purpose: use an AFM to apply a voltage between a conductive tip and the sample surface, and to measure the current o Learn about the electrical properties of the sample o Obtain high resolution topographic images in order to help study the grain boundaries and the intragrain regions in the polycrystalline Material: glass/SnO 2 /CdS/CdTe (cadmium telluride / cadmium sulfide) o CdS/CdTe solar cells are an alternative to silicon because they are potentially cheaper and CdTe has a high absorption coefficient (99% of incident light is absorbed) Procedure: a scanning probe microscope (contact mode) applies a voltage through the Si tip, sending a cone-shaped current through the CdTe and CdS, ending at the SnO 2 film where the current is collected Solar Cell Experiment Results: As deposited: o Brightness differences indicate non uniform conductivity due to different grains having different doping levels and different carrier mobilities
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This note was uploaded on 04/09/2009 for the course MSE 111 taught by Professor Giannelis during the Fall '07 term at Cornell.

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Presentation_Notes - Conductive Atomic Force Microscopy...

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