Fault Tolerant Signal Processing for Highly Scaled VLSI Signal Processors W. K. Jenkins Department of Electrical Engineering The Pennsylvania State University University Park, PA AbstractAdaptive fault tolerance (AFT) takes advantage of non-canonical adaptive filter architectures that use adaptive principles to achieve automatic fault recovery. Recent work has demonstrated the capability of AFT methods to mask single and multiple stuck-at bit errors in the filter coefficients, as well as to demonstrate the capability of AFT filters to recover from transient errors. This seminar explores how the principles of adaptive fault tolerance can be used effectively in adaptive VLSI processors that are prone to both hard and soft errors in highly integrated systems that are being scaled to smaller feature dimensions and reduced voltage thresholds. This seminar also inriduces arithmetic fault tolerance based on residue number system (RNS) coding, involving either hardware redundancy or multiple execution redundancy (MER) strategies designed to identify and overcome transient errors.
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