Scanned_probe_tutorial_ACTUAL_2005

Scanned_probe_tutorial_ACTUAL_2005 - Characterization of...

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John Marohn Chemistry 288 / Scanned Probe Microscope Tutorial Characterization of Polymers by Scanned Probe Microscopy ~ A Tutorial ~ Dr. John A. Marohn Assistant Professor (July 1999 – current) Department of Chemistry and Chemical Biology Cornell University, Ithaca, NY National Research Council Research Associate (1996 – 1999) U.S. Army Research Laboratory, Adelphi, MD Johns Hopkins Applied Physics Laboratory, Columbia, MD Ph.D. in Chemistry (1996) California Institute of Technology, Pasadena, CA
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John Marohn Chemistry 288 / Scanned Probe Microscope Tutorial Outline Part I: Principles – The atomic force microscope – Commercial instrument – Imaging modes: “contact” and “non-contact” – Homebuilt instrument – Resolution and sensitivity Part II: Advanced Measurements Examples – Chemical force microscopy – Optical imaging w/ sub-wavelength resolution
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John Marohn Chemistry 288 / Scanned Probe Microscope Tutorial Part I Principles How do commercial instruments work? What kinds of measurements can be made? What does the data mean? Do you believe it? Homebuilt instrument for studying organic electronic devices
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John Marohn Chemistry 288 / Scanned Probe Microscope Tutorial Scanning tunneling microscope “Scanning Tunneling Microscopy – From Birth to Adolescence,” Gerd Binnig and Heinrich Rohrer Nobel Lecture, December 8, 1986 Si(111) 7 x 7 reconstruction Ultrahigh Vacuum
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John Marohn Chemistry 288 / Scanned Probe Microscope Tutorial Scanning tunneling microscope + atom manipulation “Confinement of electrons to quantum corrals on a metal surface,” M.F. Crommie, C.P. Lutz, D.M. Eigler, Science 262 218 (1993) Picture courtesy of Don Eigler @ IBM Almaden http://www.almaden.ibm.com/vis/stm/corral.html Fe on Cu (111) Ultrahigh Vacuum Low temperature: 10 K
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John Marohn Chemistry 288 / Scanned Probe Microscope Tutorial Atomic force microscope Cantilever tip + van der Waals Force + Sample “Atomic Force Microscope,” C. Binning, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56 930 (1986). Figure courtesy of David Basalt, Ph.D. Thesis, Caltech (1993) Reprinted as NRL Code 6177, see http://stm2.nrl.navy.mil/how-afm/how-afm.html 25 20 15 10 5 0 nm Pentacene on SiO 2 contact mode, 298 K, in air 1 µ m
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John Marohn Chemistry 288 / Scanned Probe Microscope Tutorial Selected commercial manufacturers and web refs John Cross http://www.mobot.org/jwcross/spm/ Summary of manufacturers, tips, standards, and books is nice Asylum Research http://www.asylumresearch.com/index.asp Digital Instruments http://www.di.com/ Omicron http://www.omicron-instruments.com/ RHK Technology http://www.rhk-tech.com/ Thermomicroscopes http://www.thermomicro.com/ Weitzmann Institute of Science Surface Analysis Lab Dr. Sidney R. Cohen, director http://www.weizmann.ac.il/surflab/peter/ http://www.weizmann.ac.il/surflab/peter/links/ Nice summary of SPM manufacturers and tip suppliers and many others …
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John Marohn Chemistry 288 / Scanned Probe Microscope Tutorial
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Scanned_probe_tutorial_ACTUAL_2005 - Characterization of...

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