Reliability_redundancy_20010069514.pdf - Fundamentals of...

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Fundamentals of Digital Engineering: Designing for Reliability A Micro-Course May 2 I, 2001 Abstract The concept of designing for reliability will be introduced along with a brief ovcr,,iew of reliability, redundancy and traditional methods of fault tolerance is presented, as applied to current logic devices The fundamentals of advanced circuit design and analysis techniques will be the primary focus The introduction will cover the definitions of key device parameters and how analysis is used Io prove circuit correctness Basic design techniques such as synchronous vs asynchronous design, melastable state resolution time/arbiter design, and finite slate machine st_cture/implementation will be reviewed Advanced topics will be explored such as skew-tolerant circuit design, the use of triple-modular redundancy and circuit hazards, device transients and prevenlntive circuit design, lock-up states in finite state machines generated by logic synthesizers, device transient characteristics, radiation mitigation techniques, worst-case analysis, the use of timing analyzers and simulators, and others Case studies and lessons learned from spaceflight designs will be given as examples Introduction This Seminar This is a seminar, not a class - Two Way Conversation - Basic Theory - Lessons Learned - Case Studies for Discussion Present Your Own Case Studies for Discussion and Future Inclusion Under Development - First Time This Seminar Is Given - Not All Topics Are Fully Developed - What Areas Are Useful? Guide Development. Reliability Motivation - A Case Study (1961) First, I believe that this nation should commit itself to achieving the goal, before this decade is out, of landing a man on the moon and returning him safely to the earth, Speei_1 Message to the Congn.'ss on U_gent National Needs President lohn F Kennedy Ddivcn_d in person before a joint session of Congress May 25.1961 Reliability Motivation - A Case Study (1986) It appears that there are enormous differences of opinion as to the probability of a failure with loss of vehicle and of human life. The estimates range from roughly I in I00 to 1 in 100,000. The higher ! figures come from the working engineers, and the very low figures from management, What are the causes and consequences of this lack of agreement? Since 1 part in 100,000 would imply that one could put a Shuttle up each day for 300 years expecting to lose only one, we could properly ask "What is the cause of management's fantastic faith in the machinery?'" g R P F¢.v;ma,'m, Reporl of_¢ PRESIDENTIAL COMMISSION on the Space ShuRl¢ I Challenger Acciden t, Volume 2 Appendi.x F - Persona/Observation s on Retiabilit._o f I Shunl¢, Iun¢ 6th, 1086
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Reliability Motivation - A Case Study (2001) When discussing the impact of the high observed FIT rate for the FPGAs, the IAT asked Lockheed Martin "What's the reliability allocation?" Lockheed Martin responded, +'tlelI if I know." The IAT followed up by stating that it appeared that there has been no calculation of the probability of mission success. Lockheed Martin concurred and JPL added: "No
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