Structural DMR_soft error tolerant FIR.pdf

Structural DMR_soft error tolerant FIR.pdf - 512 IEEE...

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512 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: EXPRESS BRIEFS, VOL. 58, NO. 8, AUGUST 2011 Structural DMR: A Technique for Implementation of Soft-Error-Tolerant FIR Filters Pedro Reviriego, Chris J. Bleakley, and Juan Antonio Maestro Abstract —In this brief, an efficient technique for implemen- tation of soft-error-tolerant finite impulse response (FIR) filters is presented. The proposed technique uses two implementations of the basic filter with different structures operating in parallel. A soft error occurring in either filter causes the outputs of the filters to differ, or mismatch, for at least one sample. The filters are specifically designed so that, when a soft error occurs, they produce distinct error patterns at the filter output. An error detection circuit monitors the basic filter outputs and identifies any mismatches. An error correction circuit determines which filter is in error based on the mismatch pattern and selects the error-free filter result as the output of the overall error-protected system. This technique is referred to as structural dual modular redundancy (DMR) since it enhances traditional DMR to provide error correction, as well as error detection, by means of filter modules with different structures. The proposed technique has been implemented and evaluated. The system achieves a soft error correction rate of close to 100% for isolated single soft errors and has a logic complexity significantly less than that of conventional triple modular redundancy. Index Terms —Dual modular redundancy (DMR), filter, finite impulse response (FIR), soft errors. I. I NTRODUCTION R ELIABILITY is a major concern for advanced electronic systems [1]. Designing systems that are tolerant to soft errors is becoming increasingly important due to reductions in circuit feature size and voltage level. Soft errors are transient errors in circuit nodes that can affect both sequential and combinational elements. A wide range of techniques has been used to protect circuits against soft errors, including specialized manufacturing processes, circuit level design techniques, and system level redundancy [2]. One commonly used technique is modular redundancy whereby the circuit to be protected is replicated N times and extra logic is added to detect and correct errors. In the case that N equals two, the technique is known as dual modular redundancy (DMR). In DMR, the outputs of Manuscript received August 24, 2010; revised November 25, 2010 and February 10, 2011; accepted May 23, 2011. Date of current version August 17, 2011. This work was supported in part by the Spanish Ministry of Science and Education under Grant AYA2009-13300-C03 and in part by a University College Dublin Seed Funding grant. This paper was recommended by Associate Editor P. K. Meher. P. Reviriego and J. A. Maestro are with the Universidad Antonio de Nebrija, 28040 Madrid, Spain (e-mail: [email protected]; [email protected]).
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