- Nanoscale Characterization Microscopy Form a magnified image of an object Light waves Resolution limited by wavelength of light 200 nm smallest

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October 26, 2007 Nanoscale Characterization o Microscopy Form a magnified image of an object Light waves Resolution: limited by wavelength of light 200 nm: smallest feature resolvable by visible light microscopy o “Microscopes” for nanotech Scanning electron microscope: average 5 nm, best 1nm Transmission electron microscope: 0.1 to 0.2 nm Scanning probe microscope: 0.01 to 5 nm Scanning probe microscopy (SPM): (diagram in notebook) o Scanning tunneling microscopy (STM) o Atomic force microscopy (AFM) o Serially acquired sample property pixel by pixel. Look at region by region, and collect readings over surface regions and build up an image. Basically convert data at each pixel into a visual image. History: o Electron microscopy (1930s by Ruska) the wave-nature of electrons for imaging Wavelength of electron is 0.2 nm: resolve objects not visible with optical microscopy o G. Binnig, Rohrer Scanning tunneling microscopy (1980s) Not a “microscope” in conventional sense Sense atoms at a surface with a needle-like probe Digital image of atomic scale surface topography 1986 Nobel prize in Physics to Ruska, Binnig, Rohrer
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Without these two inventions, nanotechnology could not have started. If you can’t look at nanotech at its scale, can’t make new structures out of them.
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This note was uploaded on 10/24/2008 for the course ENGRI 1110 taught by Professor Giannelis during the Fall '07 term at Cornell University (Engineering School).

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- Nanoscale Characterization Microscopy Form a magnified image of an object Light waves Resolution limited by wavelength of light 200 nm smallest

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