OR Homework 10 - Jim P Liu ORIE 3120 HWK 10 Section 3 1...

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Jim P Liu ORIE 3120 HWK 10 Section 3 1. After the change, the box plot and Q-Q plot show very normal distributions without outliers, and the scatterplot shows a very linear distribution. There does not appear to be any problems with the variable thickness. It is clear that observation 49 was an error. Once it was changed, it is evident that there are fluctuations in thickness that occur throughout the distribution, possibly of a sinusoidal distribution. Before After
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1 2 3 4 5 6 7 8 9 10 11 12 -0.2 -0.1 0.0 0.1 0.2 0.3 fixed run 1 2 3 4 5 6 7 8 9 10 11 12 -0.2 -0.1 0.0 0.1 0.2 0.3 run run 1 2 3 4 5 6 7 8 9 10 11 12 -0.10 -0.05 0.00 0.05 0.10 wafer run 1.1 2.2 3.3 4.4 5.5 6.6 1.8 2.9 4.10 1.12 -0.2 -0.1 0.0 0.1 0.2 0.3 fixed w afer in run 1.1 2.2 3.3 4.4 5.5 6.6 1.8 2.9 4.10 1.12 -0.2 -0.1 0.0 0.1 0.2 0.3 run w afer in run 1.1 2.2 3.3 4.4 5.5 6.6 1.8 2.9 4.10 1.12 -0.10 -0.05 0.00 0.05 0.10 wafer w afer in run 2. = 10.48939 = 0.010569968 = 0.001455259 = 0.003547913 From these estimates, it appears the wafer is the main source of variability, because has the largest variance 3. In these boxplots, the residuals (fixed, run, wafer) are compared to run, and wafer in run. The variation in the 2 nd row is much more evident (wafer in run) than in first row (run). This confirms our answer to Problem 2, which gave the highest
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