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PHYSICS 002C Lecture 17

PHYSICS 002C Lecture 17 - PHYSICS 002C Lecture 17 May 6...

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PHYSICS 002C Lecture 17 May 6, 2009 Serway and Jewett Chapter 27 – Wave optics Review - Chap 27.4 Change of phase due to reflection. There is a reversal of phase upon reflection from a material of higher index or from a metallic surface [see Fig 27.7]. In the Michelson interferometer , an incoming ray is split into 2 beams by a half-silvered mirror at point A and recombined again after reflecting from two other mirrors. When the difference in the path lengths ' 2 2 a a s is equal to an integral number of wavelengths the two rays leave the bottom of mirror A as the ray labeled “out” out of phase, one ray having experienced one more external reflection than the other. Q. What change in pressure of air (which has an index of refraction n = 1.0003 at a pressure of 1 atm) in path a over a 10 cm length would change the interference pattern from one bright fringe to the next in a Michelson interferometer for light of wavelength = 600 nm? a) 1 atm ; b) 0.5 atm; c) 0.01 atm; d) 2 atm ; e) 0.001 atm DEMO Michelson interferometer Chap 27.5 Interference in thin films Antireflection coatings are ¼ wave length in thickness. However, there is an optimum value for the index of refraction of the coating; it should be the square root of the index of the index of the optic being coated.
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