Mike-Nano-hw5

# Mike-Nano-hw5 - Michael Glamore ENGRI_111 Problem Set#5 Due...

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Michael Glamore ENGRI_111, Problem Set #5 Due. Friday, Oct. 28, 2005 1. Compare and contrast the STM with the AFM. STM (Scanning Tunneling Microscope) AFM (Atomic Force Microscope) Operating Principle Force an electric current through a small tip that is nanometers apart from surface. The amount of current will determine the distance from the object. Higher current means higher elevation. Use a feedback mechanism to avoid touching the tip to actually keep the current stable, and change the distance from the object. A small tip will actually touch the material it is scanning across and a laser beam will be pointed to a deflector on the back of the tip. As the tip rises and falls, the laser will be deflected at much different angles, Using feedback mechanics, one can try to keep the deflection at a constant and change the force being applied to the arm of the tip. Essentially, it would be more beneficial to keep the force constant, trying to save the delicate tip.

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• Fall '05
• GIANI
• tip, Scanning Tunneling Microscope, Piezoelectricity, Ferroelectricity, small tip, ferroelectric material

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