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9/30/03EECS3121Lecture 9: Ratioed Logic and Pass-transistor LogicEECS 312Reading: 6.2.2, 6.2.3Exclude pages 267-268 on DCVSL
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Last Time9/30/03EECS3122•Scaling theory– Systematic approach to shrinking devices such that power, delay, area all improve• Variability– Focused on process variation where device parameters fluctuate from instance to instance– Voltage levels and temperature can also change circuit peformance