lecture24 - Last Time Lecture 24 Future trends EECS 312...

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1 EECS 312 1 Lecture 24: Future trends EECS 312 Reading: none! EECS 312 2 Last Time IR drop is voltage drop that occurs along the power/ground lines; slows things down Crosstalk noise refers to injected charge across interwire (coupling) capacitance – A quiet wire can experience a voltage glitch as a result, leading to functional failure or worsened reliability – This can also increase delay, when adjacent lines switch at the same time in opposite directions Use the Miller effect concept: Double Cc for switching in opposite direction, zero Cc for switching in same direction Lecture Overview Manufacturability What is the big limiter to continued CMOS domination? Interconnect or power or complexity or physics or process variation or verification or economics?? Advanced MOSFETs – SOI – FinFET Review session: Wednesday (tomorrow), 7pm Exam (comprehensive): Friday, 4 - 6 pm EECS 312 4 Manufacturability Deep submicron devices are becoming more difficult to manufacture reliably • Why? – Pushing lithography and other fabrication modules to their fundamental limitations Example: Optical proximity correction (OPC), phase shift
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