lecture24 - Last Time Lecture 24 Future trends EECS 312...

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1 EECS 312 1 Lecture 24: Future trends EECS 312 Reading: none! EECS 312 2 Last Time IR drop is voltage drop that occurs along the power/ground lines; slows things down • Crosstalk noise refers to injected charge across interwire (coupling) capacitance – A quiet wire can experience a voltage glitch as a result, leading to functional failure or worsened reliability – This can also increase delay, when adjacent lines switch at the same time in opposite directions • Use the Miller effect concept: Double Cc for switching in opposite direction, zero Cc for switching in same direction EECS 312 3 Lecture Overview • Manufacturability • What is the big limiter to continued CMOS domination? – Interconnect or power or complexity or physics or process variation or verification or economics?? • Advanced MOSFETs –SO I –F i nFET Review session: Wednesday (tomorrow), 7pm Exam (comprehensive): Friday, 4 - 6 pm EECS 312 4 Manufacturability • Deep submicron devices are becoming more difficult to manufacture reliably •W
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This note was uploaded on 04/01/2008 for the course EECS 312 taught by Professor Maharbiz during the Fall '07 term at University of Michigan.

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lecture24 - Last Time Lecture 24 Future trends EECS 312...

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