hw1 - IEOR 130 Methods of Manufacturing Improvement Spring,...

Info iconThis preview shows pages 1–2. Sign up to view the full content.

View Full Document Right Arrow Icon
IEOR 130 Methods of Manufacturing Improvement Spring, 2007 Prof. Leachman First homework assignment - due Tuesday, Jan. 30. 1. Briefly define the following terms: line yield, die yield, defect density, stepper throughput, overall equipment efficiency, on-time delivery. 2. Fabs A and B are identical fabs that operate only one process flow (the same one in both fabs). Fab A has 85% line yield, 90% die yield, and 85% overall equipment efficiency of the bottleneck equipment type. Fab B has 82% line yield, 98% die yield, and 60% overall equipment efficiency of the bottleneck equipment type. Which fab produces more output per unit time? Explain. What if the fabs were not identical, i.e., either the process specifications were different and/or the equipment sets were different? 3. Explain briefly why the managements of fabs producing DRAMs or Pentium chips traditionally did not emphasize reduction of flow times ("cycle times"), while the managements of ASIC fabs (i.e., fabs producing products designed by customers) traditionally have strongly
Background image of page 1

Info iconThis preview has intentionally blurred sections. Sign up to view the full version.

View Full DocumentRight Arrow Icon
Image of page 2
This is the end of the preview. Sign up to access the rest of the document.

Page1 / 2

hw1 - IEOR 130 Methods of Manufacturing Improvement Spring,...

This preview shows document pages 1 - 2. Sign up to view the full document.

View Full Document Right Arrow Icon
Ask a homework question - tutors are online