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Unformatted text preview: 1. Consider this circuit: Y Z k f h g e d A B C (a) Apply 6-valued D-algorithm to perform ATPG for SA1 fault on fanout branch h. (b) Apply PODEM algorithm and SCOAP measures to perform ATPG for SA1 fault on fanout branch h. 2. Consider the A SA0 fault in the circuit shown below: Flip Flop B A SA0 (a) Apply 5-valued logic to find a test pattern. (b) Apply 9-valued logic to find a test pattern. 1 3. Consider the a-A-Z path shown in this circuit: z B A C D b a x S1 U0 S1 S1 y (a) Find a non-robust test for falling on the a-A-z path. (b) Suppose b S 1, a U 0, x S 1 and y S 1 is a test vector. If the permitted circuit delay is 3.5 units and gate A has a delay of 5 units and others have one time unit delay, sketch the relevant waveform to show that the test is not robust. (c) Can you derive a robust test? 2...
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This note was uploaded on 08/23/2009 for the course EE 6303 taught by Professor Mehrdadnourani during the Fall '08 term at University of Texas at Dallas, Richardson.
- Fall '08
- Electrical Engineering