Diagnostic_Test - EE6326 Analog Integrated Circuit Design Fall 2008 UTD Aug 23rd 2008 Diagnostics Multiple Choices 1_A 2_F Answer Key Name In

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1 EE6326 Analog Integrated Circuit Design – Fall 2008 UTD Aug. 23 rd , 2008 Diagnostics Name:___________________________ Multiple Choices 1. __ A ___ In general an NMOS has a) higher, b) equal, c) lower channel mobility than a PMOS. 2. __ F ___ What kind of device is not included in standard analog BiCMOS technology a) NMOS, b) PMOS, c) BJT, d) Clamp Diode, e) Metal-Metal (Metal Flux) Capacitor , f) None of the above. 3. __ X ___ By tightening the backgate of an NMOS to a positive voltage supply instead of ground, the effective threshold voltage, Vt, of the NMOS is a) increased, b) decreased, c) no change, d) all the above are possible. [If the “+” voltage is not too large, effective Vtn should decrease. However it is not a good idea to tie the backgate of an NMOS to a positive voltage, it will forward bias the bulk to source pn-junction, causing malfunction of an NMOS. Thus this question is not valid and will not count.] 4. __ D ___ What small-signal voltage gain does a common-source inverter amplifier have? a
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This note was uploaded on 08/23/2009 for the course EE 6326 taught by Professor Chen-wenliu during the Fall '08 term at University of Texas at Dallas, Richardson.

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Diagnostic_Test - EE6326 Analog Integrated Circuit Design Fall 2008 UTD Aug 23rd 2008 Diagnostics Multiple Choices 1_A 2_F Answer Key Name In

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