CHE280_HW2_Solution

CHE280_HW2_Solution - CHE280/480 and MSC 431 Suggested...

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CHE280/480 and MSC 431 Suggested Answer Keys to HW#2 1. List TWO techniques that can be used to study the follwing preperties: 1) crystal phase, 2) local environments such as valence and coordination of a defect atom, 3) oxidation state of an atom in a lattice, 4) symmetry of sites/atoms, 5) composition, 6) surface topology, and 7) thermal behavior. a) X ray diffraction, Electron diffraction b) EXAFS (extended X ray absorption fine structure), XANES (X ray absorption near edge structure) c) XPS, EELS, AES d) IR, NMR e) EDX, XRD f) AFM, SEM g) TGA, DSC 2. Both X-ray diffraction and transmission electron microscopy can be used to study the size of nanoparticles. Please explain the key different in the results obtained by these two techniques. Use the equation if applicable. X ray diffraction and transmission electron microscopy can both be used to study the size of nanoparticles TEM is a direct imaging technique and is more reliable for the size analysis. For XRD, the size is not the “true” size of particles , rather the domain size of the nanocrystals based on the Sherr equation. 3. Draw the schematic band diagrams for metal, semiconductor and insulator. Using the
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This note was uploaded on 09/22/2009 for the course CHE 280 taught by Professor Yang during the Spring '09 term at Rochester.

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CHE280_HW2_Solution - CHE280/480 and MSC 431 Suggested...

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