FinalExam_2008 - ENGRD 262/ MS&E 262 Spring 2008 Final...

Info iconThis preview shows pages 1–3. Sign up to view the full content.

View Full Document Right Arrow Icon
ENGRD 262/ MS&E 262 Spring 2008 Final Exam May 13, 2008 Problem 1: ____/20 Problem 2: ____/20 Problem 3: ____/20 Problem 4: ____/20 Problem 5: ____/20
Background image of page 1

Info iconThis preview has intentionally blurred sections. Sign up to view the full version.

View Full DocumentRight Arrow Icon
1. The number of atoms per unit cell for FCC structure is a) 1 b) 2 c) 4 d) 8 2. In BCC structure which plane has the highest conductivity? b) (100) b) (110) c) (111) d) (121 ) 3. Identify the following plane a) ( 221 ) b) ( 112 ) c) ( 112 ) d) ( 221 ) 4. Identify the following defect a) grain boundary b) impurity c) screw dislocation d) edge dislocation 5. When scattering from grain boundaries significantly contributes to resistivity, the overall resistivity i) _______ with increasing grain size. When thin film surface scattering significantly contributes to resistivity, the resistivity ii) ________ with increasing film thickness. a) i) increases ii) increases b) i) increases ii) decreases c) i) decreases ii) decreases d) i) decreases ii) increases 6. Which of the following quantities is proportion to the light intensity for solar cell?
Background image of page 2
Image of page 3
This is the end of the preview. Sign up to access the rest of the document.

Page1 / 7

FinalExam_2008 - ENGRD 262/ MS&E 262 Spring 2008 Final...

This preview shows document pages 1 - 3. Sign up to view the full document.

View Full Document Right Arrow Icon
Ask a homework question - tutors are online