呂奇傑952221E231002

呂奇傑952...

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Unformatted text preview: Surface inspection of LCD panels using a fast sub-image based singular value decomposition NSC 95-2221-E-231-002- 95 01 01 95 7 31 Thin Film Transistor Liquid Crystal Displays, TFT-LCDs TFT-LCD TFT-LCD TFT-LCD Image reconstruction Singular value decomposition LCD LCD Data line Gate line (Orthonormal bases) LCD Singular values TFT-LCD (sub image) (image resolution) TFT-LCD TFT-LCD ABSTRACT Thin Film Transistor Liquid Crystal Displays (TFT-LCDs) are particularly attractive due to their full-color display capabilities, low power consumption and light weight. In order to ensure the display quality and improve the yield of LCD flat panels, the inspection of defects in the TFT-LCD panels becomes a critical task in manufacturing. In this study, we propose a machine vision approach for automatic inspection of micro defects in patterned TFT-LCD surfaces. In LCD manufacturing, perpendicular data and gate conductive lines are patterned onto the glass substrate. A thin file transistor is located at each intersection of the data and gate lines. The geometrical structure of a TFT-LCD panel surface involves repetitive, equally-spaced horizontal and vertical lines. The proposed method is based on a global image reconstruction scheme using singular value decomposition (SVD) that involves orthogonal bases. A partition procedure which separates the input image into non- overlapping sub-images is utilized to reduce the computation time of SVD. Taking the pixel image as a matrix, the singular values on the decomposed diagonal matrix represent different degrees of information from the TFT-LCD image. By selecting the dominant singular values that represent the repetitive orthogonal-line texture of the TFT-LCD surface and reconstructing the matrix by excluding the dominant singular values, the reconstructed image effectively removes the background texture and distinctly preserves anomalies. The proposed method does not rely on textural features to detect local anomalies, nor does it require a reference image for comparison. It alleviates all limitations of the feature extraction and template matching methods. Experiments from a number of real TFT-LCD panels show that the proposed method have promising results for detecting...
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呂奇傑952...

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