ENGRI1110_Lect21_Oct16_09 - Entire course is graded on a...

Info iconThis preview shows pages 1–6. Sign up to view the full content.

View Full Document Right Arrow Icon
Entire course is graded on a curve: don’t panic (yet) Midterm is 25% Projects 25% Problem Sets 15% Final 35% Cornell Median Grades:  http://registrar.sas.cornell.edu/Student/mediangradesA.html Grades for ENGRI courses historically have shown excellent performance by the  majority of students But if you are still nervous, there is a cure….
Background image of page 1

Info iconThis preview has intentionally blurred sections. Sign up to view the full version.

View Full DocumentRight Arrow Icon
Helen Newman Hall, Friday, Oct. 16, 6:00-8:45 PM Friendly Tournament (Prizes will be awarded) Play against MSE faculty and student teams Knock down some of those faculty pins! Form a team by your year, or with MSE classmates from a lecture, or along a shared interest (lepidoptery, spelunking, philately, etc.) (fill out poster in Bard Hall lobby or email your roster to umbach@ccmr.cornell.edu ) OR show up at 6 PM to join/form a team No previous bowling experience required Don’t want to bowl? Come anytime to cheer and eat pizza Pizza served about 7:15 It’s all good…and free!
Background image of page 2
Background image of page 3

Info iconThis preview has intentionally blurred sections. Sign up to view the full version.

View Full DocumentRight Arrow Icon
Scanning Tunneling Microscope: Atomic Resolution Model of Si surface 2.7 nm Imaged in STM at Cornell Tungsten tip +2 V on sample, 1 nA
Background image of page 4
Scanning Probe Microscopy Features Common between STM and AFM: •Scan range: 200 x 200 micron lateral, 10 micron vertical •Some vibration isolation required •Scan rates: 10 nm/sec to 1000 nm/sec typical 512x512 pixels at 512 pixels/sec Scanning Tunneling Microscopy (STM) Conductive samples (sustain ~50 pA at ~1 V) •Lateral resolution (tip dependent): as small as ~0.1 nm •Vertical resolution: ~0.01 nm •Image in air or vacuum Atomic Force Microscopy (AFM) •Insulating, conductive, magnetic samples •Lateral resolution (tip dependent):typically ~10 nm •Vertical resolution: typically 0.03 nm •Image in air, vacuum, fluids
Background image of page 5

Info iconThis preview has intentionally blurred sections. Sign up to view the full version.

View Full DocumentRight Arrow Icon
Image of page 6
This is the end of the preview. Sign up to access the rest of the document.

Page1 / 26

ENGRI1110_Lect21_Oct16_09 - Entire course is graded on a...

This preview shows document pages 1 - 6. Sign up to view the full document.

View Full Document Right Arrow Icon
Ask a homework question - tutors are online