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ECE354 hw4 - 3 Using the information gathered in Pb 2 and...

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NEW JERSEY INSTITUTE OF TECHNOLOGY DEPT. OF ELECTRICAL & COMPUTER ENGINEERING ACADEMIC YEAR 2008-2009 SEMESTER 2 ECE354 DIGITAL TEST HW 4 Refer to the following circuit whenever applicable: A B C D F 1 g 2 g 3 g 4 g 5 g 6 g 7 g 8 g 9 g 10 g 11 g Fig. 1. Circuit for HW4 1. Using the information from HW3 regarding undetectable faults, reduce the circuit to an irredundant form. 2. In HW2, Pbs. 4 & 5 you were asked to calculate the set of single stuck-at faults covered by the patterns ABCD =1100, and ABCD =1001. Compute the sets of single stuck-at faults covered by the rest of the patterns.
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Unformatted text preview: 3. Using the information gathered in Pb. 2 and in HW2, Pbs. 4 & 5, create the fault table against all detectable faults. 4. Reduce the fault table calculated in Pb. 3 by using properties of fault dominance and fault equivalence. 5. Using the reduced table computed in Pb. 4, compute a minimal test set that detects all the detectable single stuck-at faults in the circuit. Is your minimal test set the only minimal test set possible? 1...
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