Unformatted text preview: 3. Using the information gathered in Pb. 2 and in HW2, Pbs. 4 & 5, create the fault table against all detectable faults. 4. Reduce the fault table calculated in Pb. 3 by using properties of fault dominance and fault equivalence. 5. Using the reduced table computed in Pb. 4, compute a minimal test set that detects all the detectable single stuck-at faults in the circuit. Is your minimal test set the only minimal test set possible? 1...
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- Spring '07
- Electrical Engineering, single stuck-at faults, NEW JERSEY INSTITUTE OF TECHNOLOGY DEPT