This preview shows page 1. Sign up to view the full content.
Unformatted text preview: 3. Using the information gathered in Pb. 2 and in HW2, Pbs. 4 & 5, create the fault table against all detectable faults. 4. Reduce the fault table calculated in Pb. 3 by using properties of fault dominance and fault equivalence. 5. Using the reduced table computed in Pb. 4, compute a minimal test set that detects all the detectable single stuck-at faults in the circuit. Is your minimal test set the only minimal test set possible? 1...
View Full Document
This note was uploaded on 02/18/2010 for the course ECET 354 taught by Professor Sa during the Spring '07 term at NJIT.
- Spring '07