ECE354 S'09 hw10 - sol

ECE354 S'09 hw10 - sol - NEW JERSEY INSTITUTE OF TECHNOLOGY...

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Unformatted text preview: NEW JERSEY INSTITUTE OF TECHNOLOGY DEPT. OF ELECTRICAL & COMPUTER ENGINEERING ACADEMIC YEAR 2008-2009 SEMESTER 2 ECE354 DIGITAL TEST S OLUTION HW10 1. We have: 4 10 1 . 1- × = q , minimum detection probability in the profile k = 20, the number of faults with detection probabilities in the range ] 10 2 . 2 , 10 1 . 1 [ 4 4-- × × 3 10 8- × = th e , escape probability threshold Test length upper bound: ( 29 ( 29 ( 29 ( 29 124 , 71 10 1 . 1 1 ln 20 10 8 ln 1 ln ln 4 3 = ×- × = - =-- q k e T th 2. The aliasing probability is approximately n- 2 , where n is the LFSR width. In our case n =15. Therefore, the aliasing probability is approximately 5 15 10 05 . 3 2-- × ≈ . 3. The aliasing probability with a transition counter, for large test length, is approximately T A π 1 } Pr{ ≈ , where T is the test length Therefore: 3 10 115 . 2 71124 1 } Pr{- × ≈ × ≈ π A 4. We accumulate the contributions of each gate to the nearly-optimal weights, and then average...
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This note was uploaded on 02/18/2010 for the course ECET 354 taught by Professor Sa during the Spring '07 term at NJIT.

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ECE354 S'09 hw10 - sol - NEW JERSEY INSTITUTE OF TECHNOLOGY...

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