ECE354 S'09 hw10

ECE354 S'09 hw10 - probability of faults in this circuit as...

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NEW JERSEY INSTITUTE OF TECHNOLOGY ACADEMIC YEAR 2008-2009 SEMESTER 2 ECE354 DIGITAL TEST HW 10 A B C D F 1 g 2 g 3 g 4 g 5 g 6 g 7 g 8 g 9 g 10 g 11 g 1. A circuit is having the following detection probability profile: # of Faults Detection Probability 6 4 10 5 . 1 - × 6 4 10 6 . 1 - × 3 4 10 1 . 2 - × 5 4 10 1 . 1 - × 9 4 10 8 . 2 - × Rest of faults 4 10 1 . 3 - × Compute the test length upper bound needed to detect all faults with escape probability no larger than 3 10 8 - × . 2. The output test responses of the circuit of Pb. 1 are captured in a LFSR having 15 stages. The test length is as computed in Pb. 1. What is the approximate aliasing
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Unformatted text preview: probability of faults in this circuit as captured by this LFSR? 3. The output test responses of the circuit of Pb. 1 are captured in a transition counter having 15 stages. The test length is as computed in Pb. 1. What is the approximate aliasing probability of faults in this circuit as captured by this transition counter? 4. Compute the nearly-optimal weights for the circuit of Fig. 1. 1 5. Use the nearly-optimal weights derived in Pb. 4 to compute the detection probability of / 5 g . Compare this detection probability to that using flat random patterns. Explain the difference between the two. 2...
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ECE354 S'09 hw10 - probability of faults in this circuit as...

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