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Unformatted text preview: probability of faults in this circuit as captured by this LFSR? 3. The output test responses of the circuit of Pb. 1 are captured in a transition counter having 15 stages. The test length is as computed in Pb. 1. What is the approximate aliasing probability of faults in this circuit as captured by this transition counter? 4. Compute the nearly-optimal weights for the circuit of Fig. 1. 1 5. Use the nearly-optimal weights derived in Pb. 4 to compute the detection probability of / 5 g . Compare this detection probability to that using flat random patterns. Explain the difference between the two. 2...
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This note was uploaded on 02/18/2010 for the course ECET 354 taught by Professor Sa during the Spring '07 term at NJIT.
- Spring '07