hw1_soln

hw1_soln - EEE 350: Homework 1 Solutions Problem Solutions...

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Unformatted text preview: EEE 350: Homework 1 Solutions Problem Solutions : Yates and Goodman, 1.2.2 1.3.1 1.4.6 1.5.3 and 1.5.6 Problem 1.2.2 Solution (a) The sample space of the experiment is S = { aaa, aaf, afa, faa, ffa, faf, aff, fff } . (1) (b) The event that the circuit from Z fails is Z F = { aaf, aff, faf, fff } . (2) The event that the circuit from X is acceptable is X A = { aaa, aaf, afa, aff } . (3) (c) Since Z F X A = { aaf, aff } 6 = , Z F and X A are not mutually exclusive. (d) Since Z F X A = { aaa, aaf, afa, aff, faf, fff } 6 = S , Z F and X A are not collectively exhaustive. (e) The event that more than one circuit is acceptable is C = { aaa, aaf, afa, faa } . (4) The event that at least two circuits fail is D = { ffa, faf, aff, fff } . (5) (f) Inspection shows that C D = so C and D are mutually exclusive. (g) Since C D = S , C and D are collectively exhaustive. Problem 1.3.1 Solution The sample space of the experiment is S = { LF, BF, LW, BW } . (1) From the problem statement, we know that...
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This note was uploaded on 04/03/2008 for the course EEE 350 taught by Professor Duman during the Fall '08 term at ASU.

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hw1_soln - EEE 350: Homework 1 Solutions Problem Solutions...

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