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IEOR 130
Methods of Manufacturing Improvement
Spring, 2009. Prof. Leachman.
HW #4, due Tuesday March 3.
1. It has been claimed that all defect density models basically predict the same yield if the
average number of defects per die is less than one. To test this assertion, compute the die
yield using the simple Poisson model, the Murphy model, and the Seeds model for the
following data:
Die area
Defect Density
(sq cm)
(per sq cm)
0.10
0.5
0.20
0.5
0.50
0.5
0.50
1.0
1.00
0.5
1.00
0.75
1.00
1.0
1.00
1.5
2.00
1.5
2. Determine the underlying defect density using the Poisson model and using the
Murphy model for the following data. (The Murphy model requires iterative trial and
error calculations.)
Die area
Die yield
(sq cm)
(percent)
0.25
92.0
0.50
85.0
0.50
92.0
1.00
65.0
1.00
85.0
3. A wafer fab is considering the purchase of a new type of metal sputtering machine. In
order to decide whether or not to purchase the new machines, management would like to
determine the increased revenue per week that would be generated by the factory if the
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This note was uploaded on 03/16/2010 for the course ORMS 130 taught by Professor Leachman during the Spring '10 term at University of California, Berkeley.
 Spring '10
 Leachman

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