Midterm_2008 - IEOR130 Midterm Examination Spring, 2009...

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IEOR130 Midterm Examination Spring, 2009 Prof. Leachman Open notes. Work all problems. Each problem is worth 20 points. 1. At a particular manufacturing step, the important parameter for process control is the deposition thickness. This is measured at five points on a single wafer from each manufacturing lot passing through the step. The mean of this parameter is 380 and the standard deviation is 54. (a) Assuming the estimates of the process mean and standard deviation are valid (i.e., the process was in statistical control during the time data was collected to compute them), specify upper and lower control limits for X-bar and R charts. (b) Suppose the process mean suddenly shifts by 27. What is the probability that there will be Type II errors occurring for both of the next two manufacturing lots? 2. A simple manufacturing process consists of a sequence of four steps: Step Cpk Cp 1 1.1 1.2 2 0.9 1.3 3 0.8 1.4 4 1.5 2.0 (a) Which step is in most urgent need of process improvement? If the process was well-
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This note was uploaded on 03/16/2010 for the course ORMS 130 taught by Professor Leachman during the Spring '10 term at University of California, Berkeley.

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Midterm_2008 - IEOR130 Midterm Examination Spring, 2009...

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