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Midterm_2008

# Midterm_2008 - IEOR130 Midterm Examination Spring 2009 Prof...

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IEOR130 Midterm Examination Spring, 2009 Prof. Leachman Open notes. Work all problems. Each problem is worth 20 points. 1. At a particular manufacturing step, the important parameter for process control is the deposition thickness. This is measured at five points on a single wafer from each manufacturing lot passing through the step. The mean of this parameter is 380 and the standard deviation is 54. (a) Assuming the estimates of the process mean and standard deviation are valid (i.e., the process was in statistical control during the time data was collected to compute them), specify upper and lower control limits for X-bar and R charts. (b) Suppose the process mean suddenly shifts by 27. What is the probability that there will be Type II errors occurring for both of the next two manufacturing lots? 2. A simple manufacturing process consists of a sequence of four steps: Step Cpk Cp 1 1.1 1.2 2 0.9 1.3 3 0.8 1.4 4 1.5 2.0 (a) Which step is in most urgent need of process improvement? If the process was well- centered at each step, which step would be in most urgent need of improvement?

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