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RelativeResourceManager(21) - Scanning probe microscopy...

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Scanning probe microscopy Chem 420 November 19, 2008 Professor Ryan C. Bailey
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Principles of scanning probe microscopy (SPM) z All SPM instruments monitor interactions between small probe tips and a specimen z STM measures the tunneling current between a metallic tip and a conducting substrate z AFM measures the van der Waals force between tip and sample (also other forces)
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Development of Scanning Probe Microscopy z Binnig and Rohrer z Nobel Prize in Physics in 1986 for their design of the scanning tunneling microscope (STM). z Other tip-sample interactions including direct physical contact
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