Scanning probe
microscopy
Chem 420
November 19, 2008
Professor Ryan C. Bailey
This
preview
has intentionally blurred sections.
Sign up to view the full version.
Principles of scanning probe
microscopy (SPM)
z
All SPM instruments
monitor interactions
between small probe tips
and a specimen
z
STM measures the
tunneling current between a
metallic tip and a
conducting substrate
z
AFM measures the van der
Waals force between tip
and sample (also other
forces)
Development of Scanning
Probe Microscopy
z
Binnig and Rohrer
z
Nobel Prize in
Physics in 1986 for
their design of the
scanning tunneling
microscope (STM).
z
Other tip-sample
interactions including
direct physical
contact
This
preview
has intentionally blurred sections.
Sign up to view the full version.