EMS162_2010_Lecture1 - Levels of Structure /...

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1 1/5/2010 EMS 162 - Winter 2010 1 Yayoi Takamura Levels of Structure / Electromagnetic Spectrum Advanced Light Source f c = λ hc hf E = = atomic nuclear XRD/TEM SEM nano micro macro OM Technique Level 1/5/2010 EMS 162 - Winter 2010 2 Yayoi Takamura Alphabet Soup NSOM – Near Field Scanning Optical Microscopy OM – Optical Microscopy XPS – X-ray Photoelectron Spectroscopy or ESCA – Electron Spectroscopy for Chemical Analysis SPM – Scanning Probe Microscopy AFM – Atomic Force Microscopy MFM – Magnetic Force Micrscopy PFM – Piezo Force Microscopy SCM – Scanning Capacitance Microscopy UPS – Ultraviolet Photoemission Spectroscopy SIMS – Secondary Ion Mass Spectrometry EXAFS – Extended X-ray Absorption Fine Structure SEM – Scanning Electron Microscopy PEEM – Photoemission Electron Microscopy PIXE – Particle Induced X-ray Emission BEEM – Ballistic Electron Emission Microscopy HFS – Hydrogen Scattering Spectrometry XAS – X-ray Absorption Spectroscopy RBS – Rutherford Backscattering Spectroscopy
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This note was uploaded on 05/14/2010 for the course EMS 162 taught by Professor Howitt during the Spring '08 term at UC Davis.

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EMS162_2010_Lecture1 - Levels of Structure /...

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