lecture_17_Surface Characterization by Microscopy

lecture_17_Surface Characterization by Microscopy - Lecture...

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Lecture #17 Surface Characterization by Microscopy Reading: Chapter 21, page 607 – 621 ; Problems: 21-7,8,9. • Why do we need microscopic investigation at nanometer scale; • Scanning electron microscopy (SEM); • Overview of scanning probe microscopy (SPM) family; • Scanning tunneling microscopy (STM); • Atomic force microscopy (AFM); • Near-field scanning optical microscope (NSOM). More details about SPM can be found at http://www.science.siu.edu/chemistry/zang/research.html
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From Intel
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National Nanotechnology Initiative - Leading to the Next Industrial Revolution "My budget supports a major new National Nanotechnology Initiative, worth $500 million. … the ability to manipulate matter at the atomic and molecular level. Imagine the possibilities: materials with ten times the strength of steel and only a small fraction of the weight -- shrinking all the information housed at the Library of Congress into a device the size of a sugar cube -- detecting cancerous tumors when they are only a few cells in size . Some of our research goals may take 20 or more years to achieve, but that is precisely why there is an important role for the federal government." --- President William J. Clinton January 21, 2000 California Institute Of Technology
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Increasing Research in Nanoscience 1990 1992 1994 1996 1998 2000 2002 2004 2006 2008 0 5000 10000 15000 20000 25000 30000 35000 40000 45000 Number of Papers Years Yearly Publications in Nanoscience (SCI) 1998 2006 0 10000 40000 100 200 300 400 500 600 700 800 900 1000 1100 1200 1300 1400 1500 Years US Yearly Budget on National Nanotechnology Initiative (NNI) $$ Million Dollars
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Why at Nanoscale? Electronics miniaturization Materials Quantum size effect Complexicity Heterogeneity Biology proteins, enzymes, DNAs, all nanometer size Nanoscience Chemistry, physics, medical Chemistry, physics physics, engineering Nano-photochemistry
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Two classes of microscopy techniques based on surface raster scanning • Scanning electron microscopy (SEM) --- using an electron beam as the probe; • Scanning probe microscopy (SPM) --- using a sharp tip as the probe;
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What is SEM? • In scanning electron microscopy (SEM) an electron beam is focused into a small probe and is rastered across the surface of a specimen. • Several interactions with the sample that result in the emission of electrons or photons occur as the electrons penetrate the surface. • These emitted particles can be collected with the appropriate detector to
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This note was uploaded on 05/15/2010 for the course CHEM 434 taught by Professor None during the Spring '07 term at University of Michigan-Dearborn.

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lecture_17_Surface Characterization by Microscopy - Lecture...

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