classProblems(2)

classProblems(2) - CS 514-D Software Product Process...

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CS 514-D Software Product & Process Evaluation Data Analysis Class Problems 2006 James M. Bieman Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-1 CS 514 Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-1 Data Analysis Class Problems Class Problems Source [Fenton & Pfleeger 97], 97], James M. Bieman Computer Science Dept Colorado State University CS 514 Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-2 Problem 1 Problem 1 (see text p. 236 #10) (see text p. 236 #10) z Company X runs a large software system S which has been developed in-house over several years. z The company collects information about software 'defects' discovered by inspections. z Each defect is traced to one of the 9 subsystems of S (labeled A, B, . .., I) (each of which is the responsibility of a different team of programmers). CS 514 Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-3 Defects Discovered & Size Defects Discovered & Size System A B C D EF G H I Defects 35 0 95 35 55 40 55 40 45 Size (KLOC) 40 100 5 50 120 70 60 100 40 The manager of S receives the following summary information about new defects discovered during the last inspection:
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CS 514-D Software Product & Process Evaluation Data Analysis Class Problems 2006 James M. Bieman Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-2 CS 514 Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-4 Defect Density Defect Density System A B C D EF G H I Defects 35 0 95 35 55 40 55 40 45 Size (KLOC) 40 100 5 50 120 70 60 100 40 Defect Density 0.88 0 19.0 0.7 0.46 0.57 0.92 0.4 1.12 5 CS 514 Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-5 Outlier Analysis: Outlier Analysis: Box Plot of Defects Box Plot of Defects Defects Outliers: Systems B & C B: 0 defects C: 95 defects CS 514 Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-6 Outlier Analysis: Outlier Analysis: Box Plot of Size Box Plot of Size Size No outliers
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CS 514-D Software Product & Process Evaluation Data Analysis Class Problems 2006 James M. Bieman Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-3 CS 514 Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-7 Outlier Analysis: Outlier Analysis: Box Plot of Defect Density Box Plot of Defect Density Defects/KCLOC Outlier: System C C CS 514 Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-8 Problem 1 Conclusions Problem 1 Conclusions z Subsystem C is defect prone. Its exceptionally small with an unusually large number of defects. z Why is C defect prone? Is it highly complex? Is it the most used subsystem? Were C’s programmers the worst? CS 514 Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-9 Problem 1 Conclusions (2) Problem 1 Conclusions (2) z Subsystem B is large but without defects. Was B developed by the best programmers, tools, or methods? Was B not used very much?
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CS 514-D Software Product & Process Evaluation Data Analysis Class Problems 2006 James M. Bieman Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-4 CS 514 Copyright © 2000-2006 James M. Bieman Data Analysis Class Problems-10 Weaknesses of the Metrics Data
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classProblems(2) - CS 514-D Software Product Process...

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