MIE364S_T_2_09 - MIE364H1S Methods of Quality Control and...

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MIE364H1S Methods of Quality Control and Improvement Course Instructor: Prof. V. Makis Tutorial #2 1. The time to failure in hours of an electronic component subjected to an accelerated life test is shown below. To accelerate the failure test, the units were tested at an elevated temperature. 127 124 121 118 125 123 136 131 131 120 140 125 124 119 137 133 129 128 125 141 121 133 124 125 142 137 128 140 151 124 129 132 160 142 130 129 125 123 122 126 a. Calculate the sample average and the standard deviation. b. Construct a histogram. 2. The data below cover categories of defects found on inspection of a large aircraft. Construct a check sheet. Defect Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec Alignment 7 6 6 7 4 7 8 12 9 9 8 5 Adjust 2 1 1 1 4 3 2 2 4 Tighten 169 155 146 139 134 160 138 161 69 62 135 41 Mislocations 4 6 3 2 3 1 4 3 6 Damage-Mutilations 16 35 23 25 23 37 36 48 18 28 47 25 Missing Rivets 8 16 14 19 11 15 8 11 21 12 23 16 Defective Rivets 4 3 3 1 1 1 5 2 Oxygen Leaks 1 Hyd. System Leaks 18 12 32 5 17 20 15 19 13 30 18 15 Incorrect Air Pressure 3.
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This note was uploaded on 07/24/2010 for the course MIE MIE364 taught by Professor Makis during the Spring '10 term at University of Toronto- Toronto.

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MIE364S_T_2_09 - MIE364H1S Methods of Quality Control and...

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