Unformatted text preview: μ m SiO 2 ) has an index of refraction of 1.537 and a thickness of 600 nm. • the top cladding SiO 2 layer (which will be put on top of your structures) will have an index of refraction of 1.48 and a thickness of 3 microns. Read the documents CAREFULLY. Follow ALL DEADLINES....
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- Index Librorum Prohibitorum, Si wafer substrate, SiON layer