Important Project Instructions 2010

Important Project Instructions 2010 - μ m SiO 2 has an...

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The indices of refraction and thicknesses of the films are as follows the bottom SiO 2 layer (the layer that is directly on the Si wafer substrate) has an index of refraction of 1.449 and a thickness of 5 microns; the SiON layer (out of which the devices will be made, and this layer is on top of the 5
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Unformatted text preview: μ m SiO 2 ) has an index of refraction of 1.537 and a thickness of 600 nm. • the top cladding SiO 2 layer (which will be put on top of your structures) will have an index of refraction of 1.48 and a thickness of 3 microns. Read the documents CAREFULLY. Follow ALL DEADLINES....
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