Master GreenSheet Lectures Spring 2010 II

Master GreenSheet Lectures Spring 2010 II - Materials...

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Materials Engineering 145-S – Spring 2010 Seminars II Principles of Scanning Probe Microscopy San Jose State University Course Objectives The objective of Materials Engineering 145-S is to provide the training necessary for becoming an independent user of the Atomic Force Microscope (AFM). Basic theories of SPM will be presented, as well as instruction in operation of AFM instruments available at SJSU. Mastery of the course learning objectives will establish a basis for further study of Scanning Probe Microscopy. Topics include: Principles and practice of SPM; Basic theory and skills development of SPM Microscopy; Imaging and compositional analysis of hard and soft samples by AFM; Artifacts. Class Logistics Class Meetings : Thursday 9:00 am to noon Supervised instruction and practice on the 5500 from Agilent AFM will be provided within the normal class time. Location : Lectures and Lab will meet in Engineering 115 A Instructor: Dr. Michel Goedert Office: Engineering E115 Phone: 408-924-3987 E-mail: michel.goedert@sjsu.edu Office Hours (E385): W 12:30 to 1:30 pm Course Prerequisites Introductory course in chemistry, physics or materials engineering Required Text
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Master GreenSheet Lectures Spring 2010 II - Materials...

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