q2_guide - MIT OpenCourseWare http:/ocw.mit.edu 2.830J /...

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MIT OpenCourseWare http://ocw.mit.edu 2.830J / 6.780J / ESD.63J Control of Manufacturing Processes (SMA 6303) Spring 2008 For information about citing these materials or our Terms of Use, visit: http://ocw.mit.edu/terms .
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6.780 Quiz 2 study guide Hayden Taylor, 22 April 2008 Topic Notes References ADVANCED SPC Moving Averages Windowed Exponentially-weighted (EWMA) L9 Ss 6–16 Cumulative sum charts L9 Ss 17–24 Multivariate charts Chi-square Hotelling T 2 L9 Ss 38–45 L9 Ss 16–49 YIELD Definitions Functional yield Parametric yield Concept of critical area Murphy yield model Clustering Large α = little clustering Small α = lots of clustering L10 [Non-standard or device-specific situations] ANOVA Fixed effects model Degrees of freedom Lecture 11 FULL/FRACTIONAL FACTORIAL MODELS; DoE; REGRESSION Contrasts Sums of squares – they add up (why?) Projection to estimate effects from fractional- factorial designs Aliasing Lecture 12 Lecture 13 Lecture 14 Estimating residuals;
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This note was uploaded on 09/24/2010 for the course MECHE 2.830J taught by Professor Davidhardt during the Spring '08 term at MIT.

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q2_guide - MIT OpenCourseWare http:/ocw.mit.edu 2.830J /...

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