lecture1 - http/ocw.mit.edu MIT OpenCourseWare 2.830J...

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MIT OpenCourseWare ____________ http://ocw.mit.edu 2.830J / 6.780J / ESD.63J Control of Manufacturing Processes (SMA 6303) Spring 2008 For information about citing these materials or our Terms of Use, visit: ________________ http://ocw.mit.edu/terms .
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1 M anufacturing Control of Manufacturing Processes Subject 2.830/6.780/ESD.63 Spring 2008 Lecture #1 Introduction February 5, 2008
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2 M anufacturing Background • Pre-requisites • Your Background and Interests • Relevant Experience • Course Schedule
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3 M anufacturing Expectations • Assignments ~ Weekly • 2 Quizzes in Class • Group Project – End of term presentation – Report
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4 M anufacturing Syllabus Details Lecturers Duane Boning David Hardt Course Secretary: Sharlene Blake
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5 M anufacturing Syllabus Details Prerequisites : One of the following : – 2.008 or 2.810 Manufacturing – 2.751J or 6.152J or 6.041 or 15.064J Required Texts : – Montgomery, D.C., Introduction to Statistical Quality Control , 5 th Ed. Wiley, 2005 – May and Spanos, Fundamentals of Semiconductor Manufacturing and Process Control, John Wiley, 2006. Grading : – Problem sets 40% – Quizzes 40% – Team Projects 20% Assignments : All except project are to be individual efforts Final exam: No final exam Course URL : ( Registration and Certificate Required )
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6 M anufacturing Team Projects • Topics: – Process Diagnosis – Process Improvement – Process Optimization / Robustness – Advanced Applications • Expectations – Background research on process and problem – Use of existing data or generation of new data – Oral presentation of results – Project report from group
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7 M anufacturing Main Topics • Physical Origins of Variation – Process Sensitivities • Statistical Models and Interpretation – Process as a Random Variable(s) – Diagnosis of Problems • Effects Models and Designed Experiments – Input - Output Empirical Models • Process Optimization (Robustness) – Ideal Operating Points
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8 M anufacturing Manufacturing Process Control • Process Goals –Cos t – Quality –Ra
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9 M anufacturing Focus • Unit Operations (1) Maximizing Quality – Conformance to Specifications • (2) Improving Throughput • (3) Improving Flexibility • (4) Reducing Cost
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M anufacturing Typical Process Control Problems • Minimum feature size on a semiconductor chip has too much variability • DNA diagnostic chip has uneven flow channels • Toys never fit when assembled at home! • Next generation high density electrical
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This note was uploaded on 09/24/2010 for the course MECHE 2.830J taught by Professor Davidhardt during the Spring '08 term at MIT.

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lecture1 - http/ocw.mit.edu MIT OpenCourseWare 2.830J...

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