Lab2 - Experiment 2 The Design Fabrication and Testing of...

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Experiment 2: The Design, Fabrication and Testing of Analog IC Amplifiers ECSE 434 P R E L A B N O T E S This lab is divided into two parts: the first part involves the design of an inte- grated differential pair, and the layout of the differential amplifier and output stage. The output stage does not need to be designed in the layout phase. How- ever, it must be laid out with the differential amplifier, as it will later be designed to meet given specifications after the chip is fabricated. In the first part, the output stage will be tested with provided sample component values. The second part will include the completion of the output stage design, buffer stage, and the testing of the fabricated chip. N O T E S Get your equipment and components from the parts-master in the Trottier build- ing. Ensure that the components you design for are available from the parts-master. It is suggested to assemble some of the circuit components prior to entering the laboratory to save time. Do not rely on the signal generator amplitude readouts, measure your inputs manually with the oscilloscope. When writing the report, make sure to include the following where possible: o hand calculations o simulation results Comparing both and an explanation of your observations in the discussion will help validate your experimental findings . Comment on plots you include. Plagiarism will NOT be tolerated.
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Experiment 2: The Design, Fabrication and Testing of Analog IC Amplifiers ECSE 434 -2- Some post chip fabrication tips You will be forced to use very small input voltages in this experiment, because of the high gain of the differential amplifier. The following are suggestions to improve the quality of your results: If required, use a resistive voltage divider of known value between the signal gen- erator and your Circuit Under Test (CUT), when very small input signals are needed. Otherwise you may find that the signal amplitude control of your signal generator is too coarse. This procedure will generate high noise levels so use it only if absolutely necessary. If the signal you are trying to measure is comparable in size to the external inter- ference and to the internal noise of the oscilloscope (indicated by the thickness of the trace on the scope when set to its maximum sensitivity range), insert an op amp-based amplifier of known gain between the source and the oscilloscope. To reduce noise in the circuit, you may need to insert a lowpass LC pi-filter (Se- dra and Smith section 12.5) between each power supply and the CUT. Do this only if it produces a noticeable improvement in the signal-to-noise ratio (SNR). Keep the connection between the output of the filter and the CUT as short as pos- sible. Although potentiometers may be used to trim the operating conditions, for final testing they should be replaced by fixed resistors. This will eliminate many para- sitic effects associated with potentiometers.
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