Micro-2 - German-Jordanian University Industrial...

Info iconThis preview shows pages 1–3. Sign up to view the full content.

View Full Document Right Arrow Icon
German-Jordanian University Industrial Engineering Department Material Science Lab (IE2210) Fall 2007 Dr. Safwan A. Altarazi, Eng. Nidal Ha’boush, Eng. Abeer Daood Student Name: Nayef Fawaier 2008103042 Experiment Title: Out of Mark Title 10 Abstract 15 Introduction 15 Method 30 Results 20 Discussion and Conclusion 10 Report Organization and Neatness 100 Total Mark
Background image of page 1

Info iconThis preview has intentionally blurred sections. Sign up to view the full version.

View Full DocumentRight Arrow Icon
Material Science Lab. IE2210 Abstract Introduction The Scanning Electron Microscope, SEM, is a microscope that uses electron beam rather than light to form an image. SEM produces images of high resolution, which means that closely spaced features can be examined at a high magnification. The scanning electron microscope (SEM) uses a focused beam of high- energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample. In most applications,
Background image of page 2
Image of page 3
This is the end of the preview. Sign up to access the rest of the document.

Page1 / 4

Micro-2 - German-Jordanian University Industrial...

This preview shows document pages 1 - 3. Sign up to view the full document.

View Full Document Right Arrow Icon
Ask a homework question - tutors are online