Micro-2 - German-Jordanian University Industrial...

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German-Jordanian University Industrial Engineering Department Material Science Lab (IE2210) Fall 2007 Dr. Safwan A. Altarazi, Eng. Nidal Ha’boush, Eng. Abeer Daood Student Name: Nayef Fawaier 2008103042 Experiment Title: Out of Mark Title 10 Abstract 15 Introduction 15 Method 30 Results 20 Discussion and Conclusion 10 Report Organization and Neatness 100 Total Mark
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Material Science Lab. IE2210 Abstract Introduction The Scanning Electron Microscope, SEM, is a microscope that uses electron beam rather than light to form an image. SEM produces images of high resolution, which means that closely spaced features can be examined at a high magnification. The scanning electron microscope (SEM) uses a focused beam of high- energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample. In most applications,
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This note was uploaded on 12/18/2010 for the course APPLIED TE IE301 taught by Professor Olegvictorov during the Winter '10 term at German University in Cairo.

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Micro-2 - German-Jordanian University Industrial...

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