Info iconThis preview shows pages 1–2. Sign up to view the full content.

View Full Document Right Arrow Icon
GERMAN JORDANIAN UNIVERSITY SCHOOL OF TECHNOLOGICAL SCIENCES INDUSTRIAL ENGINEERING DEPARTMENT Material Science Laboratory "Scanning Electron Microscope" Objective Get familiar with Scanning Electron Microscope. Study SEM's operating principle. Notice some SEM's applications. Introduction The Scanning Electron Microscope, SEM, is a microscope that uses electron beam rather than light to form an image. SEM produces images of high resolution, which means that closely spaced features can be examined at a high magnification. An illustration for SEM is shown in Figure 6.1. Specimen preparation for SEM examination Preparation of samples is relatively easy. The sample to be examined must be prepared. Preparation process follows these main steps: Removal of all water, solvents, or other materials that could vaporize while in the vacuum. Firmly mount all the samples. Non-metallic samples, such as bugs, plants, fingernails, and ceramics, should be coated so they are electrically conductive. Metallic samples can be placed directly into the SEM. Figure 6.1: SEM SEM environment When SEM is used, the column must always be at a vacuum. There are many reasons for this. If the sample is in a gas filled environment, an electron beam cannot be generated or maintained because of a high instability in the beam. Gases could react with the electron source, causing it to burn out, or cause electrons in the beam to ionize, which produces random
Background image of page 1

Info iconThis preview has intentionally blurred sections. Sign up to view the full version.

View Full DocumentRight Arrow Icon
Image of page 2
This is the end of the preview. Sign up to access the rest of the document.

Page1 / 3


This preview shows document pages 1 - 2. Sign up to view the full document.

View Full Document Right Arrow Icon
Ask a homework question - tutors are online