ArgonnePaperMedsi2010 - Progress of the development of an...

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1 Progress of the development of an ultra-low-noise laser Doppler displacement meter for synchrotron radiation applications with sub-nanometer resolution Deming Shu a and Charles P. Wang b a Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, U.S.A. b Optodyne, Inc., Rancho Dominguez, CA 90220, U.S.A. Abstract To perform a sub-nanometer level measurement with centimeters measuring range, Argonne National Laboratory (ANL) developed special self-aligning multiple-reflection optics to extend its measuring resolution and improve the laser Doppler displacement meter (LDDM) signal-to-noise ratio one order of magnitude or more [1-3]. This technique has been applied to today’s hard x-ray nanoprobes successfully [4]. However, for the next generation of hard x-ray nanoprobe using multilayer Laue lenses (MLLs) with 1 – 2 nanometer x-ray focusing capability [5], the multiple-reflection optics will face design difficulties due to MLL’s restricted alignment space. A DOE Cooperative Research and Development Agreement (CRADA) between ANL and Optodyne, Inc. has been established to develop a prototype LDDM system with ultra-low noise level for linear measurements to sub-nanometer resolution for synchrotron radiation applications. To achieve higher signal to noise ratio, we have improved the heterodyne efficiency and reduced the detector shot noises by proper shielding and a low-pass filter. In this paper, we present the preliminary test results of this new LDDM system using ANL-developed single/multiple-reflection optics and weak-link stage techniques [6,7] Introduction Since 1997, a prototype laser Doppler linear encoder (LDLE) with multiple reflections has been developed at the APS. With a customized commercial laser Doppler
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This note was uploaded on 01/26/2011 for the course EXT 231 taught by Professor Gao during the Spring '10 term at UC Irvine.

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ArgonnePaperMedsi2010 - Progress of the development of an...

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